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With the ever increasing industrial demand for bigger, faster and more efficient systems, a growing number of cores is integrated on a single chip. Additionally, their performance is further maximized by simultaneously executing as many processes as possible without regarding their criticality. Even safety critical domains like railway and avionics apply these paradigms under strict certification regulations. As the number of cores is continuously expanding, the importance of cost-effectiveness grows. One way to increase the cost-efficiency of such System on Chip (SoC) is to enhance the way the SoC handles its power resources. By increasing the power efficiency, the reliability of the SoC is raised because the lifetime of the battery lengthens. Secondly, by having less energy consumed, the emitted heat is reduced in the SoC which translates into fewer cooling devices. Though energy efficiency has been thoroughly researched, there is no application of those power saving methods in safety critical domains yet. The EU project SAFEPOWER 1 targets this research gap and aims to introduce certifiable methods to improve the power efficiency of mixed-criticality real-time systems (MCRTES). This article will introduce the requirements that a power efficient SoC has to meet and the challenges such a SoC has to overcome.

Multiple bit upsets due to radiation-induced soft errors are a major concern in nanoscale technology nodes. Once such errors occur in the configuration frames of an FPGA device, they permanently affect the functionality of the mapped design. The combination of error correction schemes and configuration scrubbing is an efficient approach to avoid such permanent errors. Existing solutions exploit coding techniques with considerably high overhead to protect configuration frames against multiple bit upsets. In this paper, we propose a generic scrubbing scheme which reconstructs the erroneous configuration frame based on the concept of erasure codes. Our proposed scheme does not require any changes to the FPGA architecture. Experimental results on a Xilinx Virtex-6 FPGA device show that the proposed scheme achieves error recovery coverage of 99.30% with only 3% resource occupation while the mean time to repair is comparable with previous schemes.

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