The application of complex system engineering approaches to cell signaling networks should lead to novel understandings and, subsequently, new treatments for complex disorders. In the area of circuit fault diagnosis engineering, there are various methods to identify the defective or vulnerable components of complex digital electronic circuits. In biological systems, however, knowledge is limited regarding the vulnerability of interconnected signaling pathways to the dysfunction of each specific molecule. By developing proper biologically driven digital vulnerability assessment methods, the vulnerability of complex signaling networks to the possible dysfunction of each molecule can be determined. To show the utility of this approach, we analyzed three well-characterized signaling networks--a cellular network that regulates the activity of caspase3, a network that regulates the activity of p53, and a central nervous system network that regulates the activity of the transcription factor CREB (adenosine 3',5'-monophosphate response element-binding protein). We found important differences among the vulnerability values of different molecules. Most of the identified highly vulnerable molecules are functionally related and known key regulators of these networks. Experimental data confirmed the ability of digital vulnerability assessment to correctly predict key regulators in the CREB network. Because this approach may provide insight into key molecules that contribute to human diseases, it may aid in the identification of critical targets for drug development.

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This paper deals with a new MRAM technology whose writing scheme relies on the Spin Orbit Torque (SOT). Compared to Spin Transfer Torque (STT) MRAM, it offers a very fast switching, a quasi-infinite endurance and improves the reliability by solving the issue of "read disturb", thanks to separate reading and writing paths. These properties allow introducing SOT at all-levels of the memory hierarchy of systems and adressing applications which could not be easily implemented by STT-MRAM. We present this emerging technology and a full design framework, allowing to design and simulate hybrid CMOS/SOT complex circuits at any level of abstraction, from device to system. The results obtained are very promising and show that this technology leads to a reduced power consumption of circuits without notable penalty in terms of performance.

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Magnetic Random Access Memory (MRAM) is a very promising emerging memory technology because of its various advantages such as non-volatility, high density and scalability. In particular, Spin Orbit Torque (SOT) MRAM is gaining interest as it comes along with all the benefits of its predecessor Spin Transfer Torque (STT) MRAM, but is supposed to eliminate some of its shortcomings. Especially the split of read and write paths in SOT-MRAM promises faster access times and lower energy consumption compared to STT-MRAM. In this work, we provide a very detailed analysis of SOT-MRAM at both circuit-and architecture-level. We present a detailed evaluation of performance and energy related parameters and compare the novel SOT-MRAM with several other memory technologies. Our architecture-level analysis shows that a hybridcombination of SRAM for the L1-Data-cache, SOT-MRAM for the L1-Instruction-cache and L2-cache can reduce the energy consumption by 60 % while the performance increases by 1 % compared to an SRAM-only configuration. Moreover, the retention failure probability of SOT-MRAM is 27x smaller than the probability of radiation-induced Soft Errors in SRAM, for a 65 nm technology node. All of these advantages together make SOT-MRAM a viable choice for microprocessor caches.Index Terms-spin orbit torque, non-volatile memory, cache, hybrid, magnetic memory, reliability, failure rate 0278-0070 (c)

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