Proceedings of the 50th Annual Design Automation Conference 2013
DOI: 10.1145/2463209.2488857
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Reliable on-chip systems in the nano-era

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Cited by 164 publications
(96 citation statements)
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References 78 publications
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“…Reliability is an important concern related to task mapping, tightly connected to the workload distribution [9][10] [11]. Load imbalance decisions can generate hotspots zones (i.e.…”
Section: A C C E P T E D Mmentioning
confidence: 99%
See 1 more Smart Citation
“…Reliability is an important concern related to task mapping, tightly connected to the workload distribution [9][10] [11]. Load imbalance decisions can generate hotspots zones (i.e.…”
Section: A C C E P T E D Mmentioning
confidence: 99%
“…The first loop (lines 4-9) analyzes all clusters that have available resources to map the application, selecting the one with the smallest accumulated energy. If there are no clusters with available resources to map the application, a cluster with the smallest accumulated energy is selected, regardless the number of available resources (lines [11][12][13][14][15][16]. Note that the application is mapped in the MPSoC iff the system has available resources for the application.…”
Section: Cluster Selectionmentioning
confidence: 99%
“…Additionally, due to the continuing increase in semiconductor density, the current soft error challenges experienced in space will also occur in future terrestrial devices. [11] [8].…”
Section: Fpga Device Faults Due To Soft-errorsmentioning
confidence: 99%
“…Researchers have done experiments on systems with hard to quantify fault characteristics, such as undervolted and overclocked hardware, and found them hard to model or quantify [16,19,25]. In industry, hardware component manufacturers sacrifice some performance, die space and energy into error correction hardware to reduce the effects of manufacturing defects [13]. These difficult to model pieces of hardware are good targets for Topaz.…”
Section: Related Workmentioning
confidence: 99%