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International audienceThis paper presents a new methodology for single-event upset laser testing of commercial off-the-shelf SRAMs. This methodology is based on backside laser test and is illustrated with some experimental results obtained with a new dedicated laser test bench

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dimensional translation stage, allowing a O.lpm displacement Abstrod-A teSt vehicle has been specially realized to resolution. The beam is focused down to a spot size of lpm on the surface of the DUT. The spatial distribution of the laser beam energetic density is well-known: the lateral distribution profile is a gaussian. Thus, afler a deconvolution, the spatial resolution of the technique may be brought back to demonstrate that dinerent physical mechanisms are responsible for SEU phenomena within an elementary memaw Cell, depending on the impact location. Validation is Pedormed by means of pulsed laser equipment.

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