Time-resolved scanning of integrated circuits with a pulsed laser: application to transient fault injection in an ADC

Pouget, Vincent; Lewis, Dean; Fouillat, P.

doi:10.1109/imtc.2003.1207976

Cited by 20 publications

(13 citation statements)

References 8 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…5. The system is similar to the IXL system, at the Université Bordeaux, France [31]- [33]. At the center of the system is a tunable Spectra-Physics Ti: sapphire mode-locked Tsunami laser pumped by a 5 W Millennia Pro5s laser at 532 nm (frequency doubled from Nd: YAG diodes).…”

Section: B Picosecond Laser System For Temperature Analysesmentioning

confidence: 99%

Temperature Dependence of Spatially Resolved Picosecond Laser Induced Transients in a Deep Submicron CMOS Inverter

Laird

Yuan

et al. 2009

IEEE Trans. Nucl. Sci.

View full text Add to dashboard Cite

Spatially-resolved picosecond laser induced transients have been measured in a 0.18 m CMOS inverter test structure as a function of temperature. Sensitive -drain and -drain nodes have been scaled in size to accommodate characteristic differences between ion and laser tracks. Images based on pulse characteristics have been collected from 325 K to 400 K and transient currents extracted from laser strikes to both the OFF drain and its surroundings. With increasing temperature strikes to the OFF drain result in a pulse width which appears to broadens whilst the charge collected surprisingly decreases.

show abstract

Section: B Picosecond Laser System For Temperature Analysesmentioning

confidence: 99%

Temperature Dependence of Spatially Resolved Picosecond Laser Induced Transients in a Deep Submicron CMOS Inverter

Laird

Yuan

et al. 2009

IEEE Trans. Nucl. Sci.

View full text Add to dashboard Cite

show abstract

“…We refer to transients that drop below base line as negative going transients. The negative-going transients have longer duration, typically [10][11][12][13][14][15] and only occur for capacitive filter of 0.1 . The output waveform voltage starts to recover with a damped oscillatory behavior that persists for several microseconds.…”

Section: ) Linear Technology Rh117mentioning

confidence: 99%

Investigation of Single-Event Transients in Linear Voltage Regulators

Irom

Miyahira

Adell

et al. 2008

IEEE Trans. Nucl. Sci.

View full text Add to dashboard Cite

show abstract

“…But DLS does not provide any knowledge on when the laser causes such a change in the test result. Temporal information could be provided by targeting specific vectors or transitions with the help of a modulated laser beam [18,19]. In such a scheme the laser is turned on or off during different part of the test pattern.…”

Section: Full Dynamic Laser Stimulationmentioning

confidence: 99%

Dynamic laser stimulation techniques for advanced failure analysis and design debug applications

Beaudoin¹,

Sanchez

Perdu

2007

Microelectronics Reliability

View full text Add to dashboard Cite

Time-resolved scanning of integrated circuits with a pulsed laser: application to transient fault injection in an ADC

Cited by 20 publications

References 8 publications

Temperature Dependence of Spatially Resolved Picosecond Laser Induced Transients in a Deep Submicron CMOS Inverter

Temperature Dependence of Spatially Resolved Picosecond Laser Induced Transients in a Deep Submicron CMOS Inverter

Investigation of Single-Event Transients in Linear Voltage Regulators

Dynamic laser stimulation techniques for advanced failure analysis and design debug applications

Contact Info

Product

Resources

About