Dynamic laser stimulation techniques for advanced failure analysis and design debug applications

Fault localization by Dynamic Laser Stimulation extended testing

“…Physical defects can either pulls up or pulls down an output or bridges at least two nodes. In this case, fault isolation extensively use IDDQ testing to speedily isolate them [9]. At tester level, measurement of any abnormal consumption indicates faulty vector while design information gives faulty cell candidates.…”

“…With the Dynamic Laser Stimulation (DLS) [9] apparatus ( Fig. 6), we are no longer working with Current or Voltage Mapping Variation but with Pass-to-Fail or Fail-to-Pass Mapping To successfully apply this DLS approach, a border between pass and fail must exist.…”

Pushing Failure Mode Stimulus to Overcome the Limitations and Boundaries of Soft Defect Localization Tools

“…It relies on changes in behavior (e.g., pass-to-fail or fail-to-pass) in reaction to laser heating to identify the location of the suspected fault. DALS is one of the commonly used SDL implementations [8][9][10][11].…”

“…There are many literatures that discuss this technique and its different applications [2][3][4][5][6][7]. Dynamic Analysis by Laser Stimulation (DALS) is one of the known SDL implementations [8][9][10][11]. However, there are cases where the failure is occurring at a temperature where the laser alone is not sufficient to effectively induce a change of device behavior.…”