W.M. Loh scite author profile

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W.M. Loh

Modeling and measurement of contact resistances

Analysis and scaling of Kelvin resistors for extraction of specific contact resistivity

An accurate method to extract specific contact resistivity using cross-bridge Kelvin resistors

Post-breakdown leakage resistance and its dependence on device area

Gate oxide reliability characterization in the 100ps regime with ultra-fast transmission line pulsing system

2-D Simulations for accurate extraction of the specific contact resistivity from contact resistance data

Low-resistance submicrometer contacts to silicon

Macro-Model for Post-Breakdown 90NM and 130NM Transistors and its Applications in Predicting Chip-Level Function Failure after ESD-CDM Events

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