Modeling and measurement of contact resistances

Loh, W.M.; Swirhun, S.E.; Schreyer, T.A.; Swanson, R.M.; Saraswat, Krishna C.

doi:10.1109/t-ed.1987.22957

Cited by 139 publications

(67 citation statements)

References 22 publications

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“…However, by running the model for a matrix of these parameters, we identified rules that guarantee negligible current crowding. The rules are a straightforward extension of the one-resistive-electrode case [3] and simply require that , and , and . For the junctions we fabricated,…”

Section: E Generalized Resultsmentioning

confidence: 99%

“…However, we can reduce the computational requirements of this model by flattening it to two dimensions. This approximation is very good because the potential drop in the -direction has a negligible effect on the V+ and V potential for our test structure dimensions and resistivities [3]. However, in the case of very small contact resistance, large sheet resistance, thick wiring layers, and small junctions, the third dimension would become significant.…”

Section: A Governing Equationsmentioning

confidence: 92%

“…The effects of current crowding in these contacts have been well studied [3]. However, the results obtained from research on metal-semiconductor contacts are not directly applicable to CBKR test structures for Josephson junctions because, in the case of metal-semiconductor contacts, the metal layer may be assumed to have negligible resistance relative to the semiconductor layer, whereas in the Josephson-junction test structures the wiring layers have approximately equal resistance.…”

Section: He Critical Currentmentioning

confidence: 99%

“…To reduce the model to two dimensions, we make some assumptions [3]. Each metal layer is treated as a separate two-dimensional plane.…”

Section: B Reduction To Two Dimensionsmentioning

confidence: 99%

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Room-temperature testing for high critical-current-density Josephson junctions

Ohara

Berggren

2000

IEEE Trans. Appl. Supercond.

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Abstract-This paper demonstrates that room-temperature resistance measurements can accurately predict the critical current and normal resistance of high critical-current-density junctions. We fabricated high critical-current-density ( 200 A/ m 2 = 20 kA/cm 2 ) Nb/Al/AlO /Nb Josephson junctions in cross-bridge Kelvin resistor (CBKR) test structures and measured their electrical characteristics both at 4.2 K and at room temperature. We developed a two-dimensional mathematical model of the CBKR test structure with two resistive wiring layers in order to characterize the effect of current crowding on the room-temperature measurements. We then used the model to remove the effect of current crowding from the room-temperature measurements and correlated the values of these measurements to the electrical properties of the junctions at 4.2 K. We also identified test-structure-design rules that guarantee current crowding is negligible.

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Section: E Generalized Resultsmentioning

confidence: 99%

Section: A Governing Equationsmentioning

confidence: 92%

Section: He Critical Currentmentioning

confidence: 99%

“…To reduce the model to two dimensions, we make some assumptions [3]. Each metal layer is treated as a separate two-dimensional plane.…”

Section: B Reduction To Two Dimensionsmentioning

confidence: 99%

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Room-temperature testing for high critical-current-density Josephson junctions

Ohara

Berggren

2000

IEEE Trans. Appl. Supercond.

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“…For example, in corrosion detection [12,17,23,24], p represents the corrosion damage profile on a non-accessible boundary, and u 0 is the electrostatic measurement made on an accessible boundary. In the study of MOSFET semiconductor devices [1,7,20,21], the Robin coefficient p contains information on the quality and location of the non-accessible metal-to-silicon contact window, and voltage measurement u 0 on an accessible part is used to extract p.…”

Section: Introductionmentioning

confidence: 99%

Numerical methods for piecewise constant Robin coefficient

Ma¹

2017

J. Math. Computer Sci.

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A fast collocation method for an inverse boundary value problem

Fang

Lü

2004

Numerical Meth Engineering

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SUMMARYIn this paper, we present an implementation of a fast multiscale collocation method for boundary integral equations of the second kind, and its application to solving an inverse boundary value problem of recovering a coefficient function from a boundary measurement. We illustrate by numerical examples the insensitive nature of the map from the coefficient to measurement, and design and test a GaussNewton iteration algorithm for obtaining the best estimate of the unknown coefficient from the given measurement based on a least-squares formulation.

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Modeling and measurement of contact resistances

Cited by 139 publications

References 22 publications

Room-temperature testing for high critical-current-density Josephson junctions

Room-temperature testing for high critical-current-density Josephson junctions

Numerical methods for piecewise constant Robin coefficient

A fast collocation method for an inverse boundary value problem

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