In this paper, ab initio calculations are used to determine polarization difference in zinc blende (ZB), hexagonal (H) and wurtzite (WZ) AlN-GaN and GaN-InN superlattices. It is shown that a polarization difference exists between WZ nitride compounds, while for H and ZB lattices the results are consistent with zero polarization difference. It is therefore proven that the difference in Berry phase spontaneous polarization for bulk nitrides (AlN, GaN and InN) obtained by Bernardini et al. and Dreyer et al. was not caused by the different reference phase. These models provided absolute values of the polarization that differed by more than one order of magnitude for the same material, but they provided similar polarization differences between binary compounds, which agree also with our ab initio calculations. In multi-quantum wells (MQWs), the electric fields are generated by the well-barrier polarization difference; hence, the calculated electric fields are similar for the three models, both for GaN/AlN and InN/GaN structures. Including piezoelectric effect, which can account for 50% of the total polarization difference, these theoretical data are in satisfactory agreement with photoluminescence measurements in GaN/AlN MQWs. Therefore, the three models considered above are equivalent in the treatment of III-nitride MQWs and can be equally used for the description of the electric properties of active layers in nitride-based optoelectronic devices.
The light emission properties of color centers emitting in 3.3-4 eV region are investigated for hydrostatic pressures ranging up to 5GPa at liquid helium temperature. The light emission energy decreases with pressure less sensitively than the bandgap. This behavior at variance from the shift of the bandgap is typical of deep traps. Interestingly, hydrostatic pressure reveals the existence of levels that vary differently under pressure (smaller increase of the emission wavelength compared to the rest of the levels in this energy region or even decrease of it) with pressure. This discovery enriches the physics of the color centers operating in the UV in hBN.
Realtime
in situ
temperature monitoring in difficult experimental conditions or inaccessible environments is critical for many applications. Non-contact luminescence decay time thermometry is often the method of choice for such applications due to a favorable combination of sensitivity, accuracy and robustness. In this work, we demonstrate the feasibility of an ultrafast PbI
2
scintillator for temperature determination, using the time structure of X-ray radiation, produced by a synchrotron. The decay kinetics of the scintillations was measured over the 8–107 K temperature range using monochromatic pulsed X-ray excitation. It is found that lead iodide exhibits a very fast and intense scintillation response due to excitons and donor-acceptor pairs, with the fast decay component varying between 0.08 and 0.5 ns – a feature that can be readily exploited for temperature monitoring. The observed temperature dependence of the decay time is discussed in terms of two possible mechanisms of thermal quenching – transition over activation barrier and phonon-assisted escape. It is concluded that the latter provides a better fit to the experimental results and is consistent with the model of luminescence processes in PbI
2
. We evaluated the sensitivity and estimated the accuracy of the temperature determination as ca. ±6 K at 107 K, improving to ±1.4 K at 8 K. The results of this study prove the feasibility of temperature monitoring, using ultrafast scintillation of PbI
2
excited by X-ray pulses from a synchrotron, thus enabling non-contact
in-situ
cryothermometry with megahertz sampling rate.
Quantum well systems based on semiconductors with the wurtzite crystalline structure have found widespread applications in photonics and optoelectronic devices, such as light-emitting diodes, laser diodes, or single-photon emitters. In these structures, the radiative recombination processes can be affected by (i) the presence of strain and polarization-induced electric fields, (ii) quantum well thickness fluctuations and blurring of a well–barrier interface, and (iii) the presence of dislocations and native point defects (intentional and unintentional impurities). A separate investigation of these phenomena is not straightforward since they give rise to similar effects, such as a decrease of luminescence efficiency and decay rate, enhancement of the Stokes shift, and strong blueshift of the emission with increasing pump intensity. In this Perspective article, we review the usefulness of measurements of the quantum well luminescence as a function of the hydrostatic pressure for both scientific research and the development of light-emitting technologies. The results presented here show that high-pressure investigations combined with ab initio calculations can identify the nature of optical transitions and the main physical factors affecting the radiative efficiency in quantum well systems. Finally, we will discuss an outlook to the further possibilities to gain new knowledge about the nature of recombination processes in quantum wells using high-pressure spectroscopy.
We report defect-related photoluminescence (PL) and its vacuum ultraviolet photoluminescence excitation (PLE) spectra of aluminum nitride layers with various layer thicknesses and dislocation densities grown on two different substrates: sapphire and silicon. The defect-related transitions have been distinguished and examined in the emission and excitation spectra investigated under synchrotron radiation. The broad PL bands of two defect levels in the AlN were detected at around 3 eV and 4 eV. In the PLE spectra of these bands, a sharp excitonic peak originating most probably from the A-exciton of AlN was clearly visible. Taking into account the exciton binding energy, the measurements allow determination of the bandgaps of the investigated AlN samples and their temperature dependencies. Next, they are compared with the literature data obtained by other experimental techniques for bulk AlN crystals and layers grown on different substrates. The obtained results revealed that the AlN bandgap depends on the substrate. The theoretical analysis using density functional theory calculations showed that the effect is induced by the tetragonal strain related to the lattice mismatch between the substrate and the AlN layer, which has a strong influence on the spectral positions of the intrinsic excitons, and consequently on the bandgap of AlN layers.
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