2020
DOI: 10.1063/5.0027743
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Defect-related photoluminescence and photoluminescence excitation as a method to study the excitonic bandgap of AlN epitaxial layers: Experimental and ab initio analysis

Abstract: We report defect-related photoluminescence (PL) and its vacuum ultraviolet photoluminescence excitation (PLE) spectra of aluminum nitride layers with various layer thicknesses and dislocation densities grown on two different substrates: sapphire and silicon. The defect-related transitions have been distinguished and examined in the emission and excitation spectra investigated under synchrotron radiation. The broad PL bands of two defect levels in the AlN were detected at around 3 eV and 4 eV. In the PLE spectr… Show more

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Cited by 11 publications
(3 citation statements)
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“…5 Kaminska et al conducted studies wherein PL and photoluminescence excitation (PLE) spectra determined that the bandgap of AlN depends on the growth substrate (Si or sapphire) due to lattice mismatch and the associated strain. 6 Theoretical work is reported by Pant et al that calculates the alloy-disorder-limited electron mobility for AlGaN, with a minimum value of 136 cm 2 /V s including all scattering mechanisms, in good agreement with experiment. 7 Electrical and thermal transport in AlGaN and AlGaN heterostructures and superlattices are likewise studied by Muhin et al 8 and Tran et al, 9 respectively.…”
mentioning
confidence: 52%
“…5 Kaminska et al conducted studies wherein PL and photoluminescence excitation (PLE) spectra determined that the bandgap of AlN depends on the growth substrate (Si or sapphire) due to lattice mismatch and the associated strain. 6 Theoretical work is reported by Pant et al that calculates the alloy-disorder-limited electron mobility for AlGaN, with a minimum value of 136 cm 2 /V s including all scattering mechanisms, in good agreement with experiment. 7 Electrical and thermal transport in AlGaN and AlGaN heterostructures and superlattices are likewise studied by Muhin et al 8 and Tran et al, 9 respectively.…”
mentioning
confidence: 52%
“…The last facility provides an extremely wide excitation range for luminescence measurements (4.5-1500 eV) covering UV, VUV, and soft X-ray energy dispersion [37] and it demonstrates high potential in the luminescence studies for a wide class of inorganic materials. [10,[38][39][40][41][42][43] It is worth noting that since autumn 2021 new SUPERLUMI setup will be available for regular users at PETRA III storage ring of DESY synchrotron in Hamburg (Germany). [44]…”
Section: Vuv Excitation Spectroscopy and Synchrotron Radiationmentioning
confidence: 99%
“…Materials known as III-V binary nitrides (III-N = AlN, SiC, and GaN) [ 1 , 2 , 3 , 4 , 5 , 6 , 7 , 8 , 9 , 10 , 11 ] and their related alloys have recently drawn attention owing to their outstanding optoelectronic properties making them useful for many practical applications, such light-emitting diode lasers (LEDs). The reasons for their successful application are their plethora of physical characteristics, such as their small lattice parameter, large direct bandgap, high hardness, high temperature stability, good piezoelectric properties, and polytypism.…”
Section: Introductionmentioning
confidence: 99%