This paper presents an approach for increasing the lifetime of systems implemented on SRAM-based FPGAs, by introducing fault tolerance properties enabling the system to autonomously manage the occurrence of both transient and permanent faults. On the basis of the foreseen mission time and application environment, the designer is supported in the implementation of a system able to reconfigure itself, either by reloading the correct configuration in case of transient faults, or by relocating part of the functionality in presence of permanent faults. The result is a system implementation offering good performance and correct functionality even when faults occur. The proposed approach is evaluated in a case study to highlight the overall characteristics of the final implementation
This paper presents an algorithm for the discrimination of faults in FPGAs based on their recovery possibility; some faults can be recovered by reconfiguring the faulty part of the device, others have a destructive effect. After classification has been carried out, the suitable fault recovery strategy is applied, with the final aim of enabling the exploitation of FPGAs, in particular SRAM-based ones, for critical applications, such as the ones in the space environment. In this scenario, we investigate the reliable implementation of the fault classification algorithm, that can be so integrated in an overall reliable system.
This paper presents an enhanced design flow for the implementation of hardened systems on SRAM-based FPGAs, able to cope with the occurrence of Single Event Upsets (SEUs). The framework integrates three strategies independently designed to tackle the problem of SEUs; first a systematic methodology is used to harden the circuit exploiting an enhanced TMRbased technique, coupled with partial dynamic reconfiguration. Then, a robustness analysis is performed to identify possible TMR failures, eventually solved by a specific local re-design of the critical portions of the implementation. We present the overall flow and the benefits of the solution, experimentally evaluated on a realistic circuit.
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