We report interface and dielectric reliability characteristics of n+ polycrystalline-silicon (poly-Si)/Al2O3/Si metal–oxide–semiconductor (MOS) capacitors. Al2O3 films were prepared by atomic layer chemical vapor deposition using Al(CH3)3 and H2O vapor. Interface state density (Dit) and dielectric reliability properties of n+ poly-Si/Al2O3/Si MOS structures were examined by capacitance–voltage, conductance, current–voltage, and time-dependent dielectric breakdown measurements. The Dit of the n+ poly-Si/Al2O3/Si MOS system near the Si midgap is approximately 8×1010 eV−1 cm−2 as determined by the conductance method. Frequency dispersion as small as ∼20 mV and hysteresis of ∼15 mV were attained under the electric field of ±8 MV/cm. The gate leakage current of ∼36 Å effective thickness Al2O3 dielectric measured at the gate voltage of −2.5 V is ∼−5 nA/cm2, which is approximately three orders of magnitude lower than that of a controlled oxide (SiO2). Time-dependent dielectric breakdown data of Al2O3/Si MOS capacitors under the constant current/voltage stress reveal excellent charge-to-breakdown characteristics over controlled oxide. Reliable gate oxide integrity of Al2O3 gate dielectric is manifested by the excellent distribution of gate oxide breakdown voltage on 128 million MOS capacitors having isolation edges. Extracted time constant and capture cross section of the Al2O3/Si junction are discussed.
The equivalent oxide thickness ͑EOT͒ of high-k n-channel metal oxide semiconductor ͑NMOS͒ transistors was scaled using 3 methods, ͑i͒ reduction of the bottom interfacial layer ͑BIL͒ using NH 3 interface engineering, (ii) thickness reduction of the HfO 2 dielectric, and (iii) use of metal gate electrodes to minimize top interfacial growth formation and polysilicon depletion. NMOS transistors fabricated using these methods demonstrate 0.72 nm EOT using the NH 3 BIL with scaled HfO 2 /metal gates and 0.81 nm EOT using the O 3 BIL with scaled HfO 2 /metal gates. Charge pumping, mobility, and device performance results of these high-k NMOS transistors is discussed.
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