1996
DOI: 10.1103/physrevb.53.6893
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Γ-Xintervalley-scattering time constant for GaAs estimated from hot-electron noise spectroscopy data

Abstract: The technique to investigate hot-electron noise in doped semiconductors at electric fields over 25 kV/cm is developed. The intervalley noise temperature at room temperature is found to saturate in GaAs at 15 000 K at fields over 100 kV/cm. From electric-field dependence of noise temperature, the intervalley scattering time of high-energy electrons from the ⌫ valley into the X valleys is estimated to be 30 fs Ͻ ⌫X Ͻ60 fs.

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Cited by 11 publications
(11 citation statements)
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“…S4 and S11). In our system, electron transfer to X-valleys lying above the G-valley by De GX ≈ 550 meV is important (20). The upper valleys serve as a storage for energetic electrons and intensify the feature of nonlocal power dissipation as described below.…”
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confidence: 88%
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“…S4 and S11). In our system, electron transfer to X-valleys lying above the G-valley by De GX ≈ 550 meV is important (20). The upper valleys serve as a storage for energetic electrons and intensify the feature of nonlocal power dissipation as described below.…”
mentioning
confidence: 88%
“…Despite decades of extensive studies, the real-space characteristics of shot noise have been unknown because the existing noise probes were physically immobile (21,22). In addition, experiments have not been able to access noise frequencies higher than a few hundred gigahertz (20), which is far below the typical intrinsic scattering rate of hot electrons; thus, important signatures of ultrafast phenomena have remained obscure.…”
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confidence: 99%
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“…This work will provide useful hints to deeper understanding of the nonequilibrium properties of electrical conductors, through a simple and convenient method for modeling nonequilibrium layered conductors.Introduction. -Electro-thermal behavior is a key ingredient for understanding charge carrier transport phenomena in semiconductor devices including twodimensional (2D) materials, hetero Junctions, and strong correlated systems [1][2][3][4][5][6][7][8][9][10][11][12][13][14][15]. In small devices on nanoscales, hot electron generation and the resulting characteristic in-teraction with the host crystal lattice (or phonons) complicates the electro-thermal analysis and limits the device performance [16,17].…”
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confidence: 99%