Testing content-addressable memories using functional fault models and march-like algorithms

Lin, Kun-Jin; Wu, Cheng‐Wen

doi:10.1109/43.845082

Cited by 34 publications

(5 citation statements)

References 10 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…In Ref. [6] several functional fault models are introduced, such as the stuck-matched fault, the stuck-mismatched fault, the conditional-match fault, the partial-match fault, the equivalence-mismatch fault, the inequivalence-match fault, and so on. In other research, similar fault models are used.…”

Section: Physical Fault Models For Cam Testingmentioning

confidence: 99%

“…In the table, the second column is the test algorithm in Ref. [6] and the third column is the test algorithm in Ref. [7].…”

Section: Algorithm Comparisonmentioning

confidence: 99%

“…The proposed algorithm with N-bit match signal is listed in the 4th column and the algorithm with HIT-signal-only is listed in the The algorithm in Ref. [6] and the proposed algorithm B are both HIT-signal-only suitable. It can be found that the proposed algorithm can test all the introduced physical faults with the cost of only 3 more comparison operations and 2N more writing operations.…”

Section: Algorithm Comparisonmentioning

confidence: 99%

“…Most CAM fault models are functional fault models, which are introduced in Refs. [1][2][3][4][5][6], especially focusing on the faults in comparison part. For a CAM structure which has read ports, the faults in the storage part of CAM can be tested by March-like SRAM-based algorithms.…”

Section: Introductionmentioning

confidence: 99%

“…[5] and 10N+3L+2 operations in Ref. [6] to test write-only CAM. Du uses 3N+2L+2 operations to test the delay fault of CAM in Ref.…”

Section: Introductionmentioning

confidence: 99%

See 4 more Smart Citations

Testing content addressable memories with physical fault models

Yang

Zhong

et al. 2009

J. Semicond.

View full text Add to dashboard Cite

Content addressable memory (CAM) is widely used and its tests mostly use functional fault models. However, functional fault models cannot describe some physical faults exactly. This paper introduces physical fault models for write-only CAM. Two test algorithms which can cover 100% targeted physical faults are also proposed. The algorithm for a CAM module with N-bit match output signal needs only 2N+2L+4 comparison operations and 5N writing operations, where N is the number of words and L is the word length. The algorithm for a HIT-signal-only CAM module uses 2N+2L+5 comparison operations and 8N writing operations. Compared to previous work, the proposed algorithms can test more physical faults with a few more operations. An experiment on a test chip shows the effectiveness and efficiency of the proposed physical fault models and algorithms.

show abstract

Section: Physical Fault Models For Cam Testingmentioning

confidence: 99%

“…In the table, the second column is the test algorithm in Ref. [6] and the third column is the test algorithm in Ref. [7].…”

Section: Algorithm Comparisonmentioning

confidence: 99%

Section: Algorithm Comparisonmentioning

confidence: 99%