We have developed carbon nanotube (CNT) vias consisting of about 1000 tubes using thermal chemical vapor deposition (CVD) at a growth temperature of 450°C with cobalt catalysts, titanium carbide ohmic contacts, and tantalum barrier layers on copper wiring. The lowest resistance obtained was about 5 Ω/via. The total resistance of the CNT via was three orders of magnitude lower than that of one CNT, indicating that the current flows in parallel through about 1000 tubes. No degradation was observed for 100 hours at via current densities of 2×106 A/cm2, which is favorably compared with Cu vias.
A novel carbon composite structure consisiting of graphene multi-layers and aligned multi-walled carbon nanotubes (MWNTs) has been discovered. The composite structure, which was synthesized by chemical vapor deposition, has graphene multi-layers combined with the upper ends of vertically aligned MWNTs on a substrate. This microscopically-combined structure has been confirmed by transmission electron microscopy. The substrate with the new structure looks gray and shiny, which is completely different from the appearance of a substrate with the usual vertically-aligned MWNTs. The new composite structure is expected to have excellent electrical and thermal properties, and therefore is likely to find many applications in electronics.
Vertically aligned multiwalled carbon nanotubes (MWCNTs) were synthesized by remote plasma chemical vapor deposition at a low temperature of 390°C, which meets the requirement of the large scale integration (LSI) process. For wiring application, we measured the electrical properties of MWCNT-via structures with and without chemical mechanical polishing (CMP). The via resistances were reduced using inner shells of MWCNTs whose caps were opened due to CMP. The improved resistance after annealing at 400°C was 0.6Ω for 2μm vias. Our process is suitable for LSI because the temperature never exceeds the allowable temperature of 400°C in the Si LSI process.
We have succeeded in growing multiwall carbon nanotubes (MWNTs) with low-resistance ohmic contacts to titanium electrodes by hot-filament chemical vapor deposition (HF-CVD) using a nickel catalyst layer on a titanium electrode. The contact resistance of the sample with nickel/titanium electrodes was two orders of magnitude smaller than that of the sample with nickel catalyst electrodes without titanium. We assumed that the low-resistance ohmic contact was achieved by forming titanium carbide (TiC) during the growth at the MWNT/titanium electrode interface. Moreover, we have demonstrated the growth of vertically aligned bundles of MWNTs, which were end-bonded to the lower titanium electrodes, selectively in via holes. We believe this is the first report of such simultaneous formation of MWNTs and their end-bonded low-resistance ohmic contacts, and its first trial application to carbon nanotube (CNT) vias for future ULSI interconnects.
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