Abstract. This work addresses the development of a transparent conductive oxide (TCO)/metal stack for n-type Si solar cells featuring a tunnel oxide passivating rear contact (TOPCon). While poly-Si based passivating contacts contacted by local fire-through metallization currently show an increased recombination at the metal contacts and a poor infrared (IR) response, we aim to realize a full-area metallization which maintains the high level of surface passivation and avoids IR losses. Some research groups have reported that sputtering TCOs on poly-Si based passivating contacts degrades the surface passivation and unlike the SHJ cells this degradation cannot be cured completely at Tcure ~ 200°C. However, the higher thermal stability of TOPCon allows for higher Tcure of up to 400°C, which can effectively restore the surface passivation. On the other hand, the contact resistivity (ρc) of the TOPCon/ITO/metal contact increased by several orders of magnitude in our test structures during annealing at such high temperatures. Possible reasons like the formation of an interfacial oxide are currently under investigation. Increasing the poly-Si thickness and/or doping mitigated the effect of sputter damage, but this will come at the cost of more parasitic absorption. However, by adapting the sputter and the subsequent annealing process, we were able to realize low damage deposition of ITO (loss in implied Voc ~ 7 mV) on thin, lowly doped poly-Si layers on textured wafers, yielding reasonable contact properties (ρc ~ 40 mΩcm² of the whole rear contact stack).

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Stacks of aluminum oxide and silicon nitride are frequently used in silicon photovoltaics. In this Letter, we demonstrate that hydrogenated aluminum nitride can be an alternative to this dual-layer stack. Deposited on 1 ohm cm p-type FZ silicon, very low effective surface recombination velocities of 8 cm/s could be reached after firing at 820 °C. This excellent passivation is traced back to a high density of fixed charges at the interface of approximately -1 × 1012 cm-2 and a very low interface defect density below 5 × 1010 eV-1 cm-2. Furthermore, spectral ellipsometry measurements reveal that these aluminum nitride layers have ideal optical properties for use as anti-reflective coatings

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We present a laser-based method for the metallization of silicon heterojunction solar cells by Cu-plating. It consists of first applying a dielectric layer on the transparent conductive oxide (TCO) as a plating mask. Then, a NiV seed is transferred by laser induced forward transfer (LIFT) from a plastic carrier foil onto the wafer. In the second laser step, the NiV layer is fired through the dielectric layer to form a contact to the TCO. After the laser process, Cu-fingers are produced by plating. The dielectric plating mask remains on the cell. Parasitic plating is prevented by using an advanced reverse pulse plating process. With the first solar cells we reach a maximum efficiency of 22.2% and an efficiency gain of 0.5% abs compared to lowtemperature screen printing reference cells, due to a higher short circuit current and fill factor. The 30 mm wide fingers reach specific contact resistances down to 0.6 mV cm 2 and also, pass a tape adhesion test. We further demonstrate that the laser process does not cause any measurable open circuit voltage loss and that a precise alignment of the two laser steps is not necessary.Silicon heterojunction (SHJ) solar cells are believed to play a major role in the future PV market [1] . Compared to homojunction solar cells, they offer a superior module performance due to their higher open circuit voltage and their lower temperature coefficient. Moreover, the production is relatively simple and does not require high temperature steps. However, a drawback for this technology still is the metallization. Screen printed metallization can only be applied with special expensive low temperature silver pastes [2] , because the passivation by the amorphous silicon (a-Si) layers of SHJ cells cannot withstand temperatures above 200-250 C [3] . Lowtemperature silver pastes reach resistivities between 5 and 10 mVcm [4] , which is far higher than for standard silver pastes sintered at high temperature (>800 C). The typical width of industrially produced screen printed fingers on SHJ cells lies between 60 and 80 mm.Cu-plating as a low temperature metallization is a more suitable technology. Kaneka has recently presented a plated SHJ solar cell with 25.1% efficiency, which represents the world record for both-sidecontacted SHJ solar cells [5] . Depending on the masking approach, plated fingers can be much thinner than screen printed fingers and the resistivity of plated metal is very close to that of bulk Cu (1.7 mVcm). In fact, plating has shown to outperform low temperature screen printing due to a higher fill factor (FF) [6] and a higher short circuit current (J SC ) [7] . High peel forces (3-5 N/mm) for plated copper fingers on TCO have been measured with an intermediate seed layer [8,9] . In addition, plating imposes less mechanical stress onto the wafer than screen printing, which is an advantage in view of thinner wafers expected in the future [1] .In order to plate a grid structure on the TCO surface of SHJ cells, in most cases, a structured organic plating mask is applied, which covers...