Ion transport is an essential process for various applications including energy storage, sensing, display, memory and so on, however direct visualization of oxygen ion motion has been a challenging task, which lies in the fact that the normally used electron microscopy imaging mainly focuses on the mass attribute of ions. The lack of appropriate understandings and analytic approaches on oxygen ion motion has caused significant difficulties in disclosing the mechanism of oxides-based memristors. Here we show evidence of oxygen ion migration and accumulation in HfO2 by in situ measurements of electrostatic force gradient between the probe and the sample, as systematically verified by the charge duration, oxygen gas eruption and controlled studies utilizing different electrolytes, field directions and environments. At higher voltages, oxygen-deficient nano-filaments are formed, as directly identified employing a CS-corrected transmission electron microscope. This study could provide a generalized approach for probing ion motions at the nanoscale.

The interface between nanoparticles and polymer matrix is considered to have an important effect on the properties of nanocomposites. In this experimental study, electrostatic force microscopy (EFM) is used to study the local dielectric property of the interface of low density polyethylene (LDPE)/TiO2 nanocomposites at nanometer scale. The results show that the addition of TiO2 nanoparticles leads to a decrease in local permittivity. We then carry out the finite element simulation and confirm that the decrease of local permittivity is related to the effect of interface. According to the results, we propose several models and validate the dielectric effect and range effect of interface. Through the analysis of DSC and solid-state NMR results, we find TiO2 nanoparticles can suppress the mobility of local chain segments in the interface, which influences the dipolar polarization of chain segments in the interface and eventually results in a decrease in local permittivity. It is believed the results would provide important hint to the research of the interface in future research.

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Piezoresponse force microscopy (PFM), as a powerful nanoscale characterization technique, has been extensively utilized to elucidate diverse underlying physics of ferroelectricity. However, intensive studies of conventional PFM have revealed a growing number of concerns and limitations which are largely challenging its validity and applications. In this study, an advanced PFM technique is reported, namely heterodyne megasonic piezoresponse force microscopy (HM-PFM), which uses 10 6 to 10 8 Hz high-frequency excitation and heterodyne method to measure the piezoelectric strain at nanoscale. It is found that HM-PFM can unambiguously provide standard ferroelectric domain and hysteresis loop measurements, and an effective domain characterization with excitation frequency up to ≈110 MHz is demonstrated. Most importantly, owing to the high-frequency and heterodyne scheme, the contributions from both electrostatic force and electrochemical strain can be significantly minimized in HM-PFM. Furthermore, a special measurement of difference-frequency piezoresponse frequency spectrum (DFPFS) is developed on HM-PFM and a distinct DFPFS characteristic is observed on the materials with piezoelectricity. By performing DFPFS measurement, a truly existed but very weak electromechanical coupling in CH 3 NH 3 PbI 3 perovskite is revealed. It is believed that HM-PFM can be an excellent candidate for the ferroelectric or piezoelectric studies where conventional PFM results are highly controversial.

A device architecture for electrically configurable graphene field-effect transistor (GFET) using a graded-potential gate is present. The gating scheme enables a linearly varying electric field that modulates the electronic structure of graphene and causes a continuous shift of the Dirac points along the channel of GFET. This spatially varying electrostatic modulation produces a pseudobandgap observed as a suppressed conductance of graphene within a controllable energy range. By tuning the electrical gradient of the gate, a GFET device is reversibly transformed between ambipolar and n- and p-type unipolar characteristics. We further demonstrate an electrically programmable complementary inverter, showing the extensibility of the proposed architecture in constructing logic devices based on graphene and other Dirac materials. The electrical configurable GFET might be explored for novel functionalities in smart electronics.

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During the past decade, Scanning Probe Microscopy (SPM) based surface strain detection techniques have been extensively used in the characterization of functional materials, structures, and devices. Here, we refer these techniques as Surface Strain Force Microscopy (SSFM), which mainly includes the Piezoresponse Force Microscopy, Atomic Force Acoustic Microscopy, Atomic Force Microscopy-Infrared spectroscopy (or photothermal induced resonance), Piezomagnetic Force Microscopy, and Scanning Joule Expansion Microscopy. The inception of SSFM opens up a pathway to study the nanoscale physical properties by using a sharp tip to detect the local field-induced surface strain. Through measuring the signals of the surface strain, multiple physical properties, such as the electromechanical, mechanical, photothermal, magnetic, thermoelastic properties, can be characterized with an unprecedented spatial resolution. In order to further develop and overcome the fundamental issues and limitations of the SSFM, the multi-frequency SPM technology has been introduced to the SSFM-based techniques, leading to the emerging of multi-frequency SSFM (MF-SSFM). As a technical breakthrough of the SSFM, MF-SSFM has demonstrated substantial improvements in both performance and capability, resulting in increased attentions and numerous developments in recent years. This Perspective is, therefore, aimed at providing a preliminary summary and systematic understanding for the emerging MF-SSFM technology. We will first introduce the basic principles of conventional SSFM and multi-frequency SPM techniques, followed by a detailed discussion about the existing MF-SSFM techniques. MF-SSFM will play an increasingly important role in future nanoscale characterization of the physical properties. As a result, many more advanced and complex MF-SSFM systems are expected in the coming years.