Emerging multi-frequency surface strain force microscopy

Abstract

During the past decade, Scanning Probe Microscopy (SPM) based surface strain detection techniques have been extensively used in the characterization of functional materials, structures, and devices. Here, we refer these techniques as Surface Strain Force Microscopy (SSFM), which mainly includes the Piezoresponse Force Microscopy, Atomic Force Acoustic Microscopy, Atomic Force Microscopy-Infrared spectroscopy (or photothermal induced resonance), Piezomagnetic Force Microscopy, and Scanning Joule Expansion Microscopy. The inception of SSFM opens up a pathway to study the nanoscale physical properties by using a sharp tip to detect the local field-induced surface strain. Through measuring the signals of the surface strain, multiple physical properties, such as the electromechanical, mechanical, photothermal, magnetic, thermoelastic properties, can be characterized with an unprecedented spatial resolution. In order to further develop and overcome the fundamental issues and limitations of the SSFM, the multi-frequency SPM technology has been introduced to the SSFM-based techniques, leading to the emerging of multi-frequency SSFM (MF-SSFM). As a technical breakthrough of the SSFM, MF-SSFM has demonstrated substantial improvements in both performance and capability, resulting in increased attentions and numerous developments in recent years. This Perspective is, therefore, aimed at providing a preliminary summary and systematic understanding for the emerging MF-SSFM technology. We will first introduce the basic principles of conventional SSFM and multi-frequency SPM techniques, followed by a detailed discussion about the existing MF-SSFM techniques. MF-SSFM will play an increasingly important role in future nanoscale characterization of the physical properties. As a result, many more advanced and complex MF-SSFM systems are expected in the coming years.

AFMDAQ Visualizer: Software and guide to reconstruct and analyze images with raw external data acquisition from the atomic force microscopies

“…Recently, Dokukin and Sokolov introduced the ringing AFM mode, which enhances the capabilities of force-distance modes in probing mechanical properties at the nanoscale [2]. Moreover, multifrequency surface strain force microscopy [3] has been developed to augment existing modalities such as piezoresponse force microscopy (PFM) [4,5], atomic force infrared spectroscopy (AFM-IR) or photothermal induced resonance (PTIR) [6][7][8], piezomagnetic force microscopy (PmFM) [4,9], atomic force acoustic microscopy (AFAM) [10,11], and scanning Joule expansion microscopy (SJEM) [12]. In the 3 development of these new AFM techniques, the acquisition and analysis of external data generated by the AFM are imperative.…”