This paper presents an in-situ storage topology for ultra-high-speed burst mode imagers, enabling low noise operation while keeping a high frame depth. The proposed pixel architecture contains a 4T pinned photodiode, a correlated double sampling (CDS) amplification stage, and an in-situ memory bank. Focusing on the sampling noise, the system level trade-off of the proposed pixel architecture is discussed, showing its advantages on the noise, power, and scaling capability. Integrated with an AC coupling CDS stage, the amplification is obtained by exploiting the strong capacitance to the voltage relation of a single NMOS transistor. A comprehensive noise model is developed for optimizing the trade-off between the area and noise. As a proof-of-concept, a prototype imager with a 30 µm pixel pitch was fabricated in a CMOS 130 nm technology. A 108-cell memory bank is implemented allowing dense layout and parallel readout. Two types of CDS amplification stages were investigated. Despite the limited memory capacitance of 10 fF/cell, the photon transfer curves of both pixel types were measured over different operation speeds up to 20 Mfps showing a noise performance of 8.4 e−.

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This paper describes an optimization technique able to optimize a complete wireless receiver architecture in a reasonable amount of time. The optimizer alternates between spice level optimizations of simple building blocks and a full architecture optimization of the whole based on accurate models of the building blocks. The models of the building blocks are interpolated over the data points acquired in the Spice level simulations. The optimizer technique has been applied to the optimization of an architecture for a GPS receiver. The optimal design has been implemented in a standard 0.25µm CMOS process.