Two manufacturing protocols of silicon carbide (SiC) nanowires are discussed. The Raman spectra of produced SiC nanowires are compared with spectra of SiC powders of various grain sizes. The temperature and pressure dependence of the Raman spectra for powders is similar to that of bulk crystals, but is different for nanowires. Frequency shifts, band broadenings and the presence of shoulders are discussed in terms of crystal size, character of defects and their population. The concentration of defects in synthesized nanowires depends on the sintering method. Raman intensity enhancement of the LO phonon was observed when the wavelength of the excitation laser was changed from 780 to 514 nm.
SiC nanowires were obtained by a reaction between vapor silicon and multiwall carbon nanotubes, CNT, in vacuum at 1200 degrees C. Raman and IR spectrometry, X-ray diffraction and high resolution transmission electron microscopy, HRTEM, were used to characterize properties of SiC nanowires. Morphology and chemical composition of the nanowires was similar for all samples, but concentration of structural defects varied and depended on the origin of CNT. Stacking faults were characterized by HRTEM and Raman spectroscopy, and both techniques provided complementary results. Raman microscopy allowed studying structural defects inside individual nanowires. A thin layer of amorphous silicon carbide was detected on the surface of nanowires.
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