No abstract

Improving logic density by time-sharing, time-multiplexed FPGAs (TMFPGAs) have become an important research topic for reconfigurable computing. Due to the precedence and capacity constraints in TMFPGAs, the clustering and partitioning problems for TMFPGAs are different from the traditional ones. In this paper, we propose a two-phase hierarchical approach to solve the partitioning problem for TMFPGAs. With the precedence and capacity considerations for both phases, the first phase clusters nodes to reduce the problem size, and the second phase applies a probability-based iterative-improvement approach to minimize cut cost. Experimental results based on the Xilinx TMFPGA architecture show that our algorithm significantly outperforms previous works.

The embedded-DRAM (eDRAM) testing mixes up the techniques used for DRAM testing and SRAM testing since an eDRAM core combines DRAM cells with an SRAM interface (the so-called 1T-SRAM architecture). In this paper, we first present our test algorithm for eDRAM testing. A theoretical analysis to the leakage mechanisms of a switch transistor is also provided, based on that we can test the eDRAM at a higher temperature to reduce the total test time and maintain the same retention-fault coverage. Finally, we propose a mathematical model to estimate the defect level caused by wear-out defects under the use of error-correction-code circuitry, which is a special function used in eDRAMs compared to commodity DRAMs. The experimental results are collected based on 1-lot wafers with an 16 Mb eDRAM core.

The presence of unknown values in the simulation result is a key barrier to effective output response compaction in practice. This paper proposes a simple circuit module, called a response shaper, to reshape the scan-out responses before feeding them to a space compactor. Along with the proposed reshaping algorithm, response shapers can help the space compactor to reduce the number of undetectable modeled and un-modeled faults in the presence of unknown values. Moreover, the proposed compaction scheme is ATPGindependent and its hardware requirement is pattern-independent.In our experiments, we use a simple XOR compactor as the space compactor to evaluate the effectiveness of the response shaper. The results show that the number of undetectable faults and unobservable scan-out responses can be significantly reduced in comparison with the results of a convolutional compactor. The number of the extra scan-in bits required for the control signals of the response shapers is only a small fraction of the total test data volume. Also, its hardware overhead is acceptable and the runtime of the reshaping algorithm is scalable for large industrial designs.

No abstract

Multi-threshold CMOS (MTCMOS) is an effective powergating technique to reduce IC's leakage power consumption by turning off idle devices with MTCMOS switches. However, few existing literatures have discussed the algorithms required in MTCMOS's back-end tools. In this paper, we propose a switch-routing framework which serially connects the MTCMOS switches without violating the Manhattandistance constraint. The proposed switch-routing framework can simultaneously maximize the number of MTCMOS switches covered by its trunk path and minimize the total path length.The experimental result based on four industrial MTCMOS designs demonstrates the effectiveness and efficiency of the proposed framework compared to a solution provided by an EDA vendor and an advanced TSP solver.

No abstract

No abstract