With increasing time-to-market pressure and shortening semiconductor product cycles, more and more chips are being designed with library-based methodologies. In spite of this shift, the problem of discrete gate sizing has received significantly less attention than its continuous counterpart. On the other hand, cell sizes of many realistic libraries are sparse, for example, geometrically spaced, which makes the nearest rounding approach inapplicable as large timing violations may be introduced. Therefore, it is highly desirable to design an effective algorithm to handle this discrete gate-sizing problem. Such an algorithm is proposed in this paper. The algorithm is a continuous-solution-guided dynamic-programming-like approach. A set of novel techniques, such as locality-sensitive-hashing-based solution pruning, is also proposed to accelerate the algorithm. Our experimental results demonstrate that 1) the nearest rounding approach often leads to large timing violations and 2) compared to the well-known Coudert's approach, the new algorithm saves up to 21% in area cost while still satisfying the timing constraint.
This paper presents a novel enumerative approach, with provable and efficient pruning techniques, for dual threshold voltage (Vt) assignment at the transistor level. Since the use of low Vt may entail a substantial increase in leakage power, we formulate the problem as one of combined optimization for leakage-delay tradeoffs under Vt optimization and sizing. Based on an analysis of the effects of these two transforms on the delay and leakage, we justify a two-step procedure for performing this optimization. Results are presented on the ISCAS85 benchmark suite favorably comparing our approach with an existing sensitivity-based optimizer.
This paper derives a methodology for developing accurate convex delay models to be used for transistor sizing. A new rich class of convex functions to model gate delay is presented and the circuit delay under such a model is shown to be equivalent to a convex function. The richness of these functions is exploited to accurately model gate delay for modern designs. The delay model is incorporated into a transistor sizing algorithm based on TILOS. The models were characterized by using a set of grid points and then validated using a disjoint data set. The models were found to be within about 10% of SPICE for nearly all of the gate types considered. Also presented are the experimental results of sizing various test circuits.
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