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We propose a new DRAM-based true random number generator (TRNG) that leverages DRAM cells as an entropy source.The key idea is to intentionally violate the DRAM access timing parameters and use the resulting errors as the source of randomness. Our technique speci cally decreases the DRAM row activation latency (timing parameter t RCD ) below manufacturerrecommended speci cations, to induce read errors, or activation failures, that exhibit true random behavior. We then aggregate the resulting data from multiple cells to obtain a TRNG capable of providing a high throughput of random numbers at low latency.To demonstrate that our TRNG design is viable using commodity DRAM chips, we rigorously characterize the behavior of activation failures in 282 state-of-the-art LPDDR4 devices from three major DRAM manufacturers. We verify our observations using four additional DDR3 DRAM devices from the same manufacturers. Our results show that many cells in each device produce random data that remains robust over both time and temperature variation. We use our observations to develop D-RaNGe, a methodology for extracting true random numbers from commodity DRAM devices with high throughput and low latency by deliberately violating the read access timing parameters. We evaluate the quality of our TRNG using the commonly-used NIST statistical test suite for randomness and nd that D-RaNGe: 1) successfully passes each test, and 2) generates true random numbers with over two orders of magnitude higher throughput than the previous highest-throughput DRAM-based TRNG.

RowHammer is a circuit-level DRAM vulnerability where repeatedly accessing (i.e., hammering) a DRAM row can cause bit flips in physically nearby rows. The RowHammer vulnerability worsens as DRAM cell size and cell-to-cell spacing shrink. Recent studies demonstrate that modern DRAM chips, including chips previously marketed as RowHammer-safe, are even more vulnerable to RowHammer than older chips such that the required hammer count to cause a bit flip has reduced by more than 10X in the last decade. Therefore, it is essential to develop a better understanding and in-depth insights into the RowHammer vulnerability of modern DRAM chips to more effectively secure current and future systems.Our goal in this paper is to provide insights into fundamental properties of the RowHammer vulnerability that are not yet rigorously studied by prior works, but can potentially be 𝑖) exploited to develop more effective RowHammer attacks or 𝑖𝑖) leveraged to design more effective and efficient defense mechanisms. To this end, we present an experimental characterization using 248 DDR4 and 24 DDR3 modern DRAM chips from four major DRAM manufacturers demonstrating how the RowHammer effects vary with three fundamental properties: 1) DRAM chip temperature, 2) aggressor row active time, and 3) victim DRAM cell's physical location. Among our 16 new observations, we highlight that a RowHammer bit flip 1) is very likely to occur in a bounded range, specific to each DRAM cell (e.g., 5.4% of the vulnerable DRAM cells exhibit errors in the range 70 °C to 90 °C), 2) is more likely to occur if the aggressor row is active for longer time (e.g., RowHammer vulnerability increases by 36% if we keep a DRAM row active for 15 column accesses), and 3) is more likely to occur in certain physical regions of the DRAM module under attack (e.g., 5% of the rows are 2x more vulnerable than the remaining 95% of the rows). Our study has important practical implications on future RowHammer attacks and defenses. We describe and analyze the implications of our new findings by proposing three future RowHammer attack and six future RowHammer defense improvements.

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Machine Learning (ML) techniques have been rapidly adopted by smart Cyber-Physical Systems (CPS) and Internet-of-Things (IoT) due to their powerful decision-making capabilities. However, they are vulnerable to various security and reliability threats, at both hardware and software levels, that compromise their accuracy. These threats get aggravated in emerging edge ML devices that have stringent constraints in terms of resources (e.g., compute, memory, power/energy), and that therefore cannot employ costly security and reliability measures. Security, reliability, and vulnerability mitigation techniques span from network security measures to hardware protection, with an increased interest towards formal verification of trained ML models.This paper summarizes the prominent vulnerabilities of modern ML systems, highlights successful defenses and mitigation techniques against these vulnerabilities, both at the cloud (i.e., during the ML training phase) and edge (i.e., during the ML inference stage), discusses the implications of a resourceconstrained design on the reliability and security of the system, identifies verification methodologies to ensure correct system behavior, and describes open research challenges for building secure and reliable ML systems at both the edge and the cloud.

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