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In this paper we address the problem of verifying the equivalence of two sequential circuits. State-of-the-art sequential optimization techniques such as retiming and sequential redundancy removal can handle designs with up to hundreds or even thousands of flip-flops. However, the BDD-based approaches for verifying sequential equivalence can easily run into memory explosion for such designs. In an attempt to handle larger circuits, we modify test pattern-generation techniques for verification. The suggested approach utilizes the popular efficient backward-justification technique used in most sequential ATPG programs. We present several techniques to enhance the efficiency of this approach by (1) identifying equivalent flip-flop pairs using an induction-based algorithm, and (2) generalizing the idea of exploring the structural similarity between circuits to perform verification in stages. This ATPG-based framework is suitable for verifying circuits either with or without a reset state. In order to extend this approach to verify retimed circuits, we introduce a delay-compensationbased algorithm for preprocessing the circuits. The experimental results of verifying the correctness of circuits after sequential redundancy removal and retiming with up to several hundred flip-flops are presented.

This paper addresses the problem of locating design errors in a sequential circuit. For single-error circuits, we consider a signal f as a potential error source only if the circuit can be completely rectified by re-synthesizing f (i.e., changing the function of signal f). In order to handle larger circuits, we do not rely on Binary Decision Diagram. Instead, we search for potential error sources by a modified sequential fault simulation process. The main contributions of this paper are two-fold: (1) we derive the necessary and sufficient condition of whether an erroneous input sequence (i.e., an input sequence producing erroneous responses) can be corrected by changing the function of a particular internal signal; and (2) we propose a modified fault simulation procedure to check this condition. Our approach does not rely on any error model, and thus, is suitable for general types of errors. Furthermore, it can be easily extended to identify multiple errors. Experimental results on ISCAS89 benchmark circuits are presented to demonstrate its capability.

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Transistor-level power simulators have been popularly used to estimate the power dissipation of a CMOS circuit. These tools strike a good balance between the conventional transistor-level simulators, such as SPICE, and the logic-level power estimators with regard to accuracy and speed. However, it is still too timeconsuming to run these tools for large designs. To simulate onemillion functional vectors for a 50K-gate circuit, these power simulators may take months to complete. In this paper, we propose an approach to generate a compact set of vectors that can mimic the transition behavior of a much larger set of functional vectors, which is given by the designer or extracted from application programs. This compact set of vectors can then replace the functional vectors for power simulation to reduce the simulation time while still retaining a high degree of accuracy. We present experimental results to show the efficiency and accuracy of this approach.33rd Design Automation Conference ®

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