PSICHE (Pressure, Structure and Imaging by Contrast at High Energy) is the high-energy beam line of the SOLEIL synchrotron. The beam line is designed to study samples at extreme pressures, using diffraction, and to perform imaging and tomography for materials science and other diverse applications. This paper presents the tomograph and the use of the beam line for imaging, with emphasis on developments made with respect to existing instruments. Of particular note are the high load capacity rotation stage with free central aperture for installing large or complex samples and sample environments, x-ray mirror and filter optics for pink beam imaging, and multiple options for combining imaging and diffraction measurement. We describe how x-ray imaging techniques have been integrated into high-pressure experiments. The design and the specifications of the beam line are described, and several case studies drawn from the first user experiments are presented.

The impressive progress in the performance of synchrotron radiation sources is nowadays driven by the so-called `ultimate storage ring' projects which promise an unprecedented improvement in brightness. Progress on the detector side has not always been at the same pace, especially as far as soft X-ray 2D detectors are concerned. While the most commonly used detectors are still based on microchannel plates or CCD technology, recent developments of CMOS (complementary metal oxide semiconductor)-type detectors will play an ever more important role as 2D detectors in the soft X-ray range. This paper describes the capabilities and performance of a camera equipped with a newly commercialized backside-illuminated scientific CMOS (sCMOS-BSI) sensor, integrated in a vacuum environment, for soft X-ray experiments at synchrotron sources. The 4 Mpixel sensor reaches a frame rate of up to 48 frames s−1 while matching the requirements for X-ray experiments in terms of high-intensity linearity (>98%), good spatial homogeneity (<1%), high charge capacity (up to 80 ke−), and low readout noise (down to 2 e− r.m.s.) and dark current (3 e− per second per pixel). Performance evaluations in the soft X-ray range have been carried out at the METROLOGIE beamline of the SOLEIL synchrotron. The quantum efficiency, spatial resolution (24 line-pairs mm−1), energy resolution (<100 eV) and radiation damage versus the X-ray dose (<600 Gy) have been measured in the energy range from 40 to 2000 eV. In order to illustrate the capabilities of this new sCMOS-BSI sensor, several experiments have been performed at the SEXTANTS and HERMES soft X-ray beamlines of the SOLEIL synchrotron: acquisition of a coherent diffraction pattern from a pinhole at 186 eV, a scattering experiment from a nanostructured Co/Cu multilayer at 767 eV and ptychographic imaging in transmission at 706 eV.

Ptychography is a coherent diffraction imaging technique that measures diffraction patterns at many overlapping points on a sample and then uses an algorithm to reconstruct amplitude and phase images of the object and probe. Here, we report imaging, spectroscopy and linear dichroism ptychographic measurements at the carbon K-edge. This progress was achieved with a new generation of scientific Complementary Metal Oxide Semiconductor (sCMOS) X-ray cameras with an uncoated image sensor which has fast image transfer and high quantum efficiency at the carbon K-edge. Reconstructed amplitude and phase contrast images, C 1s spectral stacks, and X-ray linear dichroism of carbon nanotubes at the carbon K-edge were measured with ptychography. Ptychography and conventional Scanning Transmission X-ray Microscopy (STXM) are compared using results acquired from the same area. Relative to STXM, ptychography provides both improved spatial resolution and improved image quality. We used defocus ptychography, with an X-ray beam spot size of 1.0 micron, in order to reduce radiation damage and carbon deposition. Comparable spatial resolution was achieved to that of ptychography performed with a focused beam. Ptychography at the carbon K-edge offers unique opportunities to perform high resolution spectromicroscopy on organic materials important in medicine, biology, environmental science and energy materials.

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A commercial scientific camera has been adapted and characterized at the SOLEIL Synchrotron with the aim to improve the acquisition capabilities on the soft X-ray coherent scattering experimental station at SEXTANTS beamline. This device is equipped by the last generation of back side illuminated scientific CMOS (BSI-sCMOS) of 2048 by 2048 pixels of 11 m² able to acquire low noise images with a frame rate up to 48 Hz. The camera's performance measurements have been done and shows a good level of readout noise, a large full-well capacity, a medium dark current and a good homogeneity, respectively, 1.6 e-rms (in High Gain mode), 80 000 e-(in Low Gain mode), < 5 e-/pixel/s and ~ 1%. The quantum efficiency (QE) measurement has been performed at the soft x-ray branch of the METROLOGIE beamline and gives a relatively good agreement with the expected theoretical values. Finally, the demonstration of the camera's efficiency and of the gain in useful time measurement related to the high frame rate have been performed with a series of Airy patterns images compared with an image recorded using the standard BSI-CDD already in operation at the SEXTANTS beamline.

In order to deliver VUV (vacuum ultraviolet) photons under atmospheric pressure conditions, a differential pumping system has been built on the DISCO beamline at the SOLEIL synchrotron radiation facility. The system is made of four stages and is 840 mm long. The conductance-limiting body has been designed to allow practicable optical alignment. VUV transmission of the system was tested under air, nitrogen, argon and neon, and photons could be delivered down to 60 nm (20 eV).

Results of measurements made at the SIRIUS beamline of the SOLEIL synchrotron for a new X-ray beam position monitor based on a super-thin single crystal of diamond grown by chemical vapor deposition (CVD) are presented. This detector is a quadrant electrode design processed on a 3 µm-thick membrane obtained by argon-oxygen plasma etching the central area of a CVD-grown diamond plate of 60 µm thickness. The membrane transmits more than 50% of the incident 1.3 keV energy X-ray beam. The diamond plate was of moderate purity (∼1 p.p.m. nitrogen), but the X-ray beam induced current (XBIC) measurements nevertheless showed a photo-charge collection efficiency approaching 100% for an electric field of 2 V µm(-1), corresponding to an applied bias voltage of only 6 V. XBIC mapping of the membrane showed an inhomogeneity of more than 10% across the membrane, corresponding to the measured variation in the thickness of the diamond plate before the plasma etching process. The measured XBIC signal-to-dark-current ratio of the device was greater than 10(5), and the X-ray beam position resolution of the device was better than a micrometer for a 1 kHz sampling rate.

The new ANATOMIX beamline at Synchrotron SOLEIL is dedicated to hard X-ray full-field tomography techniques. Operating in a range of photon energies from approximately 5 to 50 keV, it offers both parallel-beam projection microtomography and nanotomography using a zone-plate transmission X-ray microscope and thus covers a range of spatial resolution from 20 nm to 20 µm, expressed in terms of useful pixel size. Here we describe the microtomography instrumentation and its performance.