Total L‐X‐ray cross‐sections are measured for proton bombardment of thick targets from Ni, Cu, Zn, Cd, Mo, Rh, Pd, and W in the energy range between 70 and 500 keV. The vacancy production cross‐section is calculated and compared with theory. Systematic deviations are observed for low projectile energies between the experimentally and theoretically determined ionisation cross‐sections in dependence on the nuclear charge of the target atoms.
The influence of alkali metal implantations in silicon on the negative secondary ion emission is studied. It is observed that the effect of negative ion signal enhancement decreases with increasing ionization potential from Cs to Na but depends lineary on the alkali volume concentration for all alkali metals. Natrium exhibits a somewhat deviating behaviour, which can be explained by its comparable high ionization potential.
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