ABSTRACT

Transient faults due to neutron

We propose a fault-tolerant approach to reliable microprocessor design. Our

Abstract

Transient faults due to neutron and alpha particle strikes pose a significant obstacle to increasing processor transistor counts in future technologies. Although fault rates of individual transistors may not rise significantly, incorporating more transistors into a device makes that device more likely to encounter a fault. Hence, maintaining processor error rates at acceptable levels will require increasing design effort.

No abstract

The design and implementation of a modern microprocessor creates many reliability challenges. Designers must verify the correctness of large complex systems and construct implementations that work reliably in varied (and occasionally adverse) operating conditions. In our previous work, we proposed a solution to these problems by adding a simple, easily verifiable checker processor at pipeline retirement. Performance analyses of our initial design were promising, overall slowdowns due to checker processor hazards were less than 3%. However, slowdowns for some outlier programs were larger. In this paper, we examine closely the operation of the checker processor. We identify the specific reasons why the initial design works well for some programs, but slows others. Our analyses suggest a variety of improvements to the checker processor storage system. Through the addition of a 4k checker cache and eight entry store queue, our optimized design eliminates virtually all core processor slowdowns. Moreover, we develop insights into why the optimized checker processor performs well, insights that suggest it should perform well for any program.

Abstract