Techniques to Reduce the Soft Error Rate of a High-Performance Microprocessor

Weaver, Christopher; Emer, Joel; Mukherjee, S.; Reinhardt, Steven K.

doi:10.1145/1028176.1006723

Cited by 154 publications

(97 citation statements)

References 29 publications

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“…Moreover, a single bit flip in parity protected processor structures such as register files could also lead to a DUE. DUEs typically result in the crash (fail-stop) of applications since it is not possible for the faulted processor/hardware to recover [21]. The third class of errors consists of Silent Data Corruptions (SDCs).…”

Section: Error Classification and Failure Modelmentioning

confidence: 99%

Designing and Modelling Selective Replication for Fault-Tolerant HPC Applications

Subaşi

Yalcin

Zyulkyarov

et al. 2017

2017 17th IEEE/ACM International Symposium on Cluster, Cloud and Grid Computing (CCGRID)

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Abstract-Fail-stop errors and Silent Data Corruptions (SDCs) are the most common failure modes for High Performance Computing (HPC) applications. There are studies that address fail-stop errors and studies that address SDCs. However few studies address both types of errors together. In this paper we propose a software-based selective replication technique for HPC applications for both fail-stop errors and SDCs. Since complete replication of applications can be costly in terms of resources, we develop a runtime-based technique for selective replication. Selective replication provides an opportunity to meet HPC reliability targets while decreasing resource costs. Our technique is low-overhead, automatic and completely transparent to the user.

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Section: Error Classification and Failure Modelmentioning

confidence: 99%

Designing and Modelling Selective Replication for Fault-Tolerant HPC Applications

Subaşi

Yalcin

Zyulkyarov

et al. 2017

2017 17th IEEE/ACM International Symposium on Cluster, Cloud and Grid Computing (CCGRID)

View full text Add to dashboard Cite

show abstract

“…Moreover, a single bit flip in parity protected processor structures such as register files could also lead to a DUE. DUEs typically result in the crash of applications since it is not possible for the faulted processor/hardware to recover [42]. The third class of errors consists of Silent Data Corruptions (SDCs).…”

Section: A Error Classification and Failure Modelmentioning

confidence: 99%

A Runtime Heuristic to Selectively Replicate Tasks for Application-Specific Reliability Targets

Subaşi

Yalcin

Zyulkyarov

et al. 2016

2016 IEEE International Conference on Cluster Computing (CLUSTER)

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Abstract-In this paper we propose a runtime-based selective task replication technique for task-parallel high performance computing applications. Our selective task replication technique is automatic and does not require modification/recompilation of OS, compiler or application code. Our heuristic, we call App FIT, selects tasks to replicate such that the specified reliability target for an application is achieved. In our experimental evaluation, we show that App FIT selective replication heuristic is low-overhead and highly scalable. In addition, results indicate that complete task replication is overkill for achieving reliability targets. We show that with App FIT, we can tolerate pessimistic exascale error rates with only 53% of the tasks being replicated.

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“…First, Weaver et al [20] proposed the π bit to address false detected errors. Every instruction and register entry is associated with a single π bit.…”

Section: Related Workmentioning

confidence: 99%