1990
DOI: 10.1016/0169-4332(90)90168-y
|View full text |Cite
|
Sign up to set email alerts
|

Ultra-flat p-n junctions formed by solid source laser doping

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

1993
1993
2015
2015

Publication Types

Select...
5

Relationship

0
5

Authors

Journals

citations
Cited by 6 publications
(1 citation statement)
references
References 1 publication
0
1
0
Order By: Relevance
“…The latter is used to form, by means of pico-second (ps) laser processing, localized p þ Back-Surface-Field (BSF) regions at rear local contacts. Several approaches have been used in the past for laser doping [12][13][14]; however, in this work we focus on the use of a self-aligned process as it is used for the laser doped selective emitter technology [15]. In this way the dielectric ablation and the local-BSF are formed simultaneously by laser processing and the firing step to form the local-BSF via Al-Si alloying is not needed anymore.…”
Section: Introductionmentioning
confidence: 99%
“…The latter is used to form, by means of pico-second (ps) laser processing, localized p þ Back-Surface-Field (BSF) regions at rear local contacts. Several approaches have been used in the past for laser doping [12][13][14]; however, in this work we focus on the use of a self-aligned process as it is used for the laser doped selective emitter technology [15]. In this way the dielectric ablation and the local-BSF are formed simultaneously by laser processing and the firing step to form the local-BSF via Al-Si alloying is not needed anymore.…”
Section: Introductionmentioning
confidence: 99%