2014
DOI: 10.1016/j.ssc.2013.10.011
|View full text |Cite
|
Sign up to set email alerts
|

Strain induced composition profile in InGaN/GaN core–shell nanowires

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1

Citation Types

1
13
0

Year Published

2015
2015
2025
2025

Publication Types

Select...
8
1

Relationship

0
9

Authors

Journals

citations
Cited by 21 publications
(14 citation statements)
references
References 15 publications
1
13
0
Order By: Relevance
“…[ 40 ] In addition, the InGaN layer exhibits a distinctively higher HAADF contrast compared with its semipolar counterpart, which indicates a higher In concentration. Issues like In incorporation on different crystal facets, [ 41 ] the sophisticated strain distribution for three dimensional grown structures, [ 42 ] supply of In atoms from the semipolar facets to the top surface [ 43 ] as well as surface conditions [ 44 ] and atomic configurations [ 23,41h ] could have a significant influence on the In incorporation in InGaN layers grown on 3D structures. [ 45 ] At the top interface of the first c ‐plane InGaN layer, a V‐pit is opened and induces additional nanofacets on which the subsequent GaN and InGaN layers are deposited epitaxially.…”
Section: Resultsmentioning
confidence: 99%
“…[ 40 ] In addition, the InGaN layer exhibits a distinctively higher HAADF contrast compared with its semipolar counterpart, which indicates a higher In concentration. Issues like In incorporation on different crystal facets, [ 41 ] the sophisticated strain distribution for three dimensional grown structures, [ 42 ] supply of In atoms from the semipolar facets to the top surface [ 43 ] as well as surface conditions [ 44 ] and atomic configurations [ 23,41h ] could have a significant influence on the In incorporation in InGaN layers grown on 3D structures. [ 45 ] At the top interface of the first c ‐plane InGaN layer, a V‐pit is opened and induces additional nanofacets on which the subsequent GaN and InGaN layers are deposited epitaxially.…”
Section: Resultsmentioning
confidence: 99%
“…Even within these domains different indium concentrations are observed, as shown in the nanoprisms. Issues like the different indium incorporation on different crystal facets 32 39 , the sophisticated strain distribution for three dimensional grown structures 40 45 as well as surface conditions 25 and atomic configurations 39 , 46 could have a significant influence on the indium incorporation in InGaN nanorod shell layers. We want to point out that the growth mechanism of these domains is much more complex compared to the proposed model of Griffiths et al .…”
Section: Resultsmentioning
confidence: 99%
“…This enhanced Indium content could be e.g. caused by different strain states at the transition between facets [30], [31]. The junction in this position would have a lower onset potential which leads to a dominant EL emission around 535 nm at low injection currents [32]; in particular using a point contact placed on the top part of the sidewall.…”
Section: Fin Ledmentioning
confidence: 99%