Selective area growth has been applied to fabricate a homogeneous array of GaN nanocolumns (NC) with high crystal quality. The structural and optical properties of single NCs have been investigated at the nanometer-scale by transmission electron microscopy (TEM) and highly spatially resolved cathodoluminescence (CL) spectroscopy performed in a scanning transmission electron microscope (STEM) at liquid helium temperatures. TEM cross-section analysis reveals excellent structural properties of the GaN NCs. Sporadically, isolated basal plane stacking faults (BSF) can be found resulting in a remarkably low BSF density in the almost entire NC ensemble. Both, defect-free NCs and NCs with few BSFs have been investigated. The low defect density within the NCs allows the characterization of individual BSFs, which is of high interest for studying their optical properties. Direct nanometer-scale correlation of the CL and STEM data clearly exhibits a spatial correlation of the emission at 360.6 nm (3.438 eV) with the location of basal plane stacking faults of type I1.
Using cathodoluminescence spectroscopy directly performed in a scanning transmission electron microscope at liquid helium temperatures, the optical and structural properties of a 62 InGaN/GaN multiple quantum well embedded in an AlInN/GaN based microcavity are investigated at the nanometer scale. We are able to spatially resolve a spectral redshift between the individual quantum wells towards the surface. Cathodoluminescence spectral linescans allow directly visualizing the critical layer thickness in the quantum well stack resulting in the onset of plastic relaxation of the strained InGaN/GaN system.
Intense emission from GaN islands embedded in AlN resulting from GaN/AlN quantum well growth is directly resolved by performing cathodoluminescence spectroscopy in a scanning transmission electron microscope. Line widths down to 440 μeV are measured in a wavelength region between 220 and 310 nm confirming quantum dot like electronic properties in the islands. These quantum dot states can be structurally correlated to islands of slightly enlarged thicknesses of the GaN/AlN quantum well layer preferentially formed in vicinity to dislocations. The quantum dot states exhibit single photon emission in Hanbury Brown-Twiss experiments with a clear antibunching in the second order correlation function at zero time delay.
Color‐tunable InGaN/GaN multi‐quantum‐well (MQW) light‐emitting diodes (LEDs) are reported based on GaN microfacet structure directly grown on c‐plane patterned sapphire substrate by metal organic vapor phase epitaxy (MOVPE) through promoting 3D growth. By adjusting GaN growth temperature and pattern arrangement, a GaN microfacet with almost pure {10true1¯1} semipolar facets is obtained. The multifacetted InGaN/GaN MQW LED chip evolves three distinct emission peaks around 630, 530, and 450 nm in electroluminescence (EL) as injection current increases from 1 to 100 mA. The EL behavior originates from locally different facets of the complex 3D structure: MQWs grown on c‐planes and semipolar facets, respectively, which is confirmed by cathodoluminescence characterization in a scanning transmission electron microscope (STEM‐CL). Considering the dependence of emission wavelength and intensity on injection currents, a programmable power supply is designed to drive the LED. The specific color of the LED is tuned by time‐shared driving of the currents based on three channels with controllable magnitudes and duty cycle from the power supply, covering red, yellow, green, cyan, blue, and purple. Furthermore, white LEDs with high color rendering index (CRI) up to 96.1 and correlated color temperature (CCT) between 4000 and 10 000 K are achieved.
Higher indium incorporation in self-organized triangular nanoprisms at the edges of InGaN/GaN core-shell nanorods is directly evidenced by spectral cathodoluminescence microscopy in a scanning transmission electron microscope. The nanoprisms are terminated by three 46 nm wide a-plane nanofacets with sharp interfaces forming a well-defined equilateral triangular base in the basal plane. Redshifted InGaN luminescence and brighter Z-contrast are resolved for these structures compared to the InGaN layers on the nanorod sidewalls, which is attributed to at least 4 % higher indium content. Detailed analysis of the inner optical and structural properties reveals luminescence contributions from 417 nm up to 500 nm peak wavelength proving the increasing indium concentration inside the nanoprism towards the nanorod surface.
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