2009 Design, Automation &Amp; Test in Europe Conference &Amp; Exhibition 2009
DOI: 10.1109/date.2009.5090795
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Process Variation Aware SRAM/Cache for aggressive voltage-frequency scaling

Abstract: Abstract-this paper proposes a novel Process Variation

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Cited by 19 publications
(12 citation statements)
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“…There have been several efforts at the device level to investigate custom SRAM architectures to improve the reliability of embedded memories, from re-arrangement of the physical-addresses [76], the introduction of customized logic [84], and different cell sizes [17], [53], [72] at the cost of increases in area.…”
Section: B Reliable Memory Subsystemsmentioning
confidence: 99%
“…There have been several efforts at the device level to investigate custom SRAM architectures to improve the reliability of embedded memories, from re-arrangement of the physical-addresses [76], the introduction of customized logic [84], and different cell sizes [17], [53], [72] at the cost of increases in area.…”
Section: B Reliable Memory Subsystemsmentioning
confidence: 99%
“…Though many techniques have been proposed for leakage reduction of the cache memories [4][5] [6] [7][8] [9] [10], the main contribution of our technique is addressing both SRAM failure-and leakage-induced yield losses under process variation in 3D microprocessors. To the best of our knowledge, this is the first work which considers both SRAM failures and leakage-induced yield losses in 3D microprocessors.…”
Section: Introductionmentioning
confidence: 99%
“…The hard errors can appear due to process variation, aging, and others [4] [5] [6]. As described in [1] an effective graceful degradation method for set associative cache memories called SAM (Self Adaptive cache Memories) was proposed.…”
Section: Introductionmentioning
confidence: 99%