PROBA-II Technology Demonstration Module in-flight data analysis

Harboe-Sorensen,; Poivey,; Zadeh,; Keating,; Fleurinck,; Puimege,; Guerre,; Lochon,; Kaddour,; Li, Qing; Walter,

doi:10.1109/radecs.2011.6131440

Cited by 10 publications

(5 citation statements)

References 4 publications

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“…This is a 16 Mb, multichip SRAM module, comprising four dies, and covering an area of 19.8 × 19.8 mm 2 . Designed for space applications, the ESA monitor is radiation hardened, and immune to MBUs [19]- [22]. Three identical reference ESA SEU monitors were installed in parallel in the SPS-NA, each mounted on one plexiglass plate (setup 1, 2, and 3, from the closest to the furthest to the beam), as shown in Fig.…”

Section: A Beam Attenuation During Parallel Board Testingmentioning

confidence: 99%

Single Event Effect Testing With Ultrahigh Energy Heavy Ion Beams

Kastriotou

Wyrwoll

Bernhard

et al. 2020

IEEE Trans. Nucl. Sci.

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Single event effect (SEE) testing with ultrahigh energy (UHE) heavy ions, such as the beams provided at CERN, presents advantages related to their long ranges with a constant linear energy transfer value. In the present work, the possibility to test components in parallel is being examined, and results from the CERN 2018 UHE Pb test campaigns are studied. Furthermore, the generation of multibit upsets by the UHE Pb ions is evaluated, and the contribution of possible fragments to the SEE measurements is discussed.

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Section: A Beam Attenuation During Parallel Board Testingmentioning

confidence: 99%

Single Event Effect Testing With Ultrahigh Energy Heavy Ion Beams

Kastriotou

Wyrwoll

Bernhard

et al. 2020

IEEE Trans. Nucl. Sci.

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“…The ESA SEU Monitor is an SRAM-based radiation detector which has been characterized in a broad range of facilities and can therefore be used as a so-called golden chip in order to measure the beam intensity and homogeneity in an experimental context [9]- [12]. HI tests were performed by ESA on the SEU Monitor in five different test facilities covering an LET range of ∼1-65 MeVcm 2 /mg and an energy range of ∼10-1500 MeV/n.…”

Section: Heavy Ion Measurementsmentioning

confidence: 99%

Sub-LET Threshold SEE Cross Section Dependency With Ion Energy

Alía

Bahamonde

Brandenburg

et al. 2015

IEEE Trans. Nucl. Sci.

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This study focuses on the ion species and energy dependence of the heavy ion SEE cross section in the sub-LET threshold region through a set of experimental data. In addition, a Monte Carlo based model is introduced and applied, showing a good agreement with the data in the several hundred MeV/n range while evidencing large discrepancies with the measurements in the 10-30 MeV/n interval, notably for the Ne ion. Such discrepancies are carefully analyzed and discussed. Abstract-This study focuses on the ion species and energy dependence of the heavy ion SEE cross section in the sub-LET threshold region through a set of experimental data. In addition, a Monte Carlo based model is introduced and applied, showing a good agreement with the data in the several hundred MeV/n range while evidencing large discrepancies with the measurements in the 10-30 MeV/n interval, notably for the Ne ion. Such discrepancies are carefully analyzed and discussed.

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“…This is a reference monitor developed by the European Space Agency (ESA) [26]. It has been used to characterize the radiation field of space applications [27] and of different radiation facilities [28][29][30][31]. The ESA monitor is based on the detection of SEEs occurring in a set of 4 ICs of a well calibrated 4 Mbit SRAM (Atmel AT60142F), for a total of 16 Mbit.…”

Section: See Measurements With Sramsmentioning

confidence: 99%