Single Event Effect Testing With Ultrahigh Energy Heavy Ion Beams

Abstract

Single event effect (SEE) testing with ultrahigh energy (UHE) heavy ions, such as the beams provided at CERN, presents advantages related to their long ranges with a constant linear energy transfer value. In the present work, the possibility to test components in parallel is being examined, and results from the CERN 2018 UHE Pb test campaigns are studied. Furthermore, the generation of multibit upsets by the UHE Pb ions is evaluated, and the contribution of possible fragments to the SEE measurements is discussed.

Longitudinal Direct Ionization Impact of Heavy Ions on See Testing for Ultrahigh Energies

“…In the frame of the high-energy physics lead ion operation at CERN in November 2018, the Super Proton Synchrotron Experimental North Area (SPS-NA) served to irradiate several electronic devices with a 150-GeV/n 208 Pb beam. The beam was delivered in bunches of 8-s duration, with a periodicity of ∼45 s and intensities ranging from 10 3 to 10 5 ions per bunch, resulting in a flux between 10 2 and 10 4 ions/cm 2 /s [10].…”

“…Unfortunately, when it comes to UHE heavy ions, the interaction between the shielding material, device packaging, or any material present between the particle and the SV leads to fragmentation. Therefore, the interactions between the very energetic ion and the material need to be taken into account when looking at SEE rates and protection of a device [10], [38].…”

“…In addition to heavy ions of various energies, 200 MeV protons are widely used, e.g., at the Paul Scherrer Institute (PSI) [9], which represents like RADEF and UCL, an European Space Agency (ESA)-supported facility. Energetic ions are of special interest, since the radiation environment in space, focusing on the galactic cosmic-ray (GCR) spectrum, consists of heavy ions with energies mainly extending up to the UHE regime, defined as 5-150 GeV/n in [10]- [12].…”

“…In our previous work, focused on UHE heavy ion beams available at CERN, the advantages and challenges of these beams have been discussed. García Alía et al [12] focused on the radial ionization structure of UHE heavy ion beams, Fernández-Martínez et al [11] discussed the experimental results and approaches for SEE testing in the specific beams available at CERN 2017 and 2018, whereas Kastriotou et al [10] investigated the impact of beam composition of the mentioned beams. Furthermore, Criswell et al [15] analyzed the occurring beam fragmentation in silicon and possible impact of SEEs caused by nuclear interaction in the sub-LET region.…”

“…These electronic components are smaller than in the past, more sensitive, and with increasingly complex structures [23]. All such complexities are removed when a UHE ion beam, for example, 208 Pb at 150 GeV/n [10]- [12], [17], is employed. Moreover, 3-D structures and stacked boards [10] can also be exposed to such a beam, as long as the beam does not experience high fragmentation and loss of intensity.…”