2008
DOI: 10.1007/978-3-540-76664-3_9
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Optical Plasma Diagnostics During Reactive Magnetron Sputtering

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Cited by 7 publications
(6 citation statements)
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“…These oxygen molecules are also ionized and produce some oxygen atoms by dissociation, which are in turn ionized. Time-resolved OESmeasurements support the notion of increased oxygen dissociation during the high-power pulse [25]. This concentration of atomic oxygen increases with a certain delay from the start of the pulse, as compared to the argon concentration.…”
Section: Hipims Pulsesupporting
confidence: 54%
“…These oxygen molecules are also ionized and produce some oxygen atoms by dissociation, which are in turn ionized. Time-resolved OESmeasurements support the notion of increased oxygen dissociation during the high-power pulse [25]. This concentration of atomic oxygen increases with a certain delay from the start of the pulse, as compared to the argon concentration.…”
Section: Hipims Pulsesupporting
confidence: 54%
“…If a constant metal concentration throughout the film is required, the process should initially be run with a closed shutter in front of the magnetron source and with no high voltage applied to the sample holder until a steady state is reached. The state of the target poisoning can be controlled by means of optical spectrometry [26], for example, provided that there is a line of sight to the plasma in front of the magnetron sputter source.…”
Section: Preparation Process and Metal Contentmentioning
confidence: 99%
“…The abovementioned variations of the plasma characteristics, which, in turn, impact the plasma-surface interaction, can be monitored by ad hoc plasma analysis measurements as described in [73][74][75][76].…”
Section: Introduction To Sputteringmentioning
confidence: 99%