2011
DOI: 10.1088/0022-3727/44/11/115201
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Angular-resolved energy flux measurements of a dc- and HIPIMS-powered rotating cylindrical magnetron in reactive and non-reactive atmosphere

Abstract: To cite this version:W P Leroy, S Konstantinidis, S Mahieu, R Snyders, D Depla. Angular-resolved energy flux measurements of a dc-and HIPIMS-powered rotating cylindrical magnetron in reactive and non-reactive atmosphere. Journal of Physics D: Applied Physics, IOP Publishing, 2011, 44 (11) A rotating cylindrical magnetron equipped with a titanium target, was sputtered in DC and in HIPIMS mode, both in metallic and in oxide regime. For all sputter modes, the same process conditions and the same average sputterin… Show more

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Cited by 33 publications
(17 citation statements)
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“…Furthermore, the heating due to energetic particle bombardment might melt thermally sensitive substrates, such as plastics. Comparative studies of the energy flux in HiPIMS and DCMS have shown that the total energy flux is of the same order 53 or lower 54,55 in the case of HiPIMS sputtering. This difference can be explained by the lower deposition rate for HiPIMS resulting in fewer bombarding particles per time unit (see Section II D).…”
Section: B Plasma Conditionsmentioning
confidence: 99%
“…Furthermore, the heating due to energetic particle bombardment might melt thermally sensitive substrates, such as plastics. Comparative studies of the energy flux in HiPIMS and DCMS have shown that the total energy flux is of the same order 53 or lower 54,55 in the case of HiPIMS sputtering. This difference can be explained by the lower deposition rate for HiPIMS resulting in fewer bombarding particles per time unit (see Section II D).…”
Section: B Plasma Conditionsmentioning
confidence: 99%
“…However, the reduction in the deposition rate was not more pronounced for materials with low sputtering yield as had been concluded from measured data. 23 Konstantinidis et al 192 find that the deposition rate depends on the pulse length and increases from 20% to 70% of dcMS values as the pulse length is decreased from 20 to 5 ls for the same average power of 300 W when sputtering a titanium target in argon at 1.33 Pa. For a rotating cylindrical magnetron Leroy et al 191 find the deposition rate to be up to 75% lower for HiPIMS compared to dcMS, and the decrease in deposition rate becomes more pronounced with increased pulse length. This may be due to the fact that the shorter pulse length does not allow the gas rarefaction, self-sputtering and other processes to develop (these mechanisms will be discussed in more detail in Sec.…”
Section: Deposition Ratementioning
confidence: 99%
“…However, the introduction of HiPIMS may further increase the process complexity, since the trajectory for ionised sputtered material leaving the target differs for HiPIMS as compared to e.g. DCMS [27,28], and any preferential resputtering effects may be more pronounced owing to the high ion irradiation of the growing film. Reports on nonreactive HiPIMS from compound targets are scarcely found, although examples exist.…”
Section: Introductionmentioning
confidence: 99%