Network analyzer measurement de-embedding utilizing a distributed transmission matrix bisection of a single THRU structure

Daniel, Erik S.; Harff, N. E.; Sokolov, V. G.; Schreiber, S.; Gilbert, Barry K.

doi:10.1109/arftg.2004.1387856

Cited by 21 publications

(7 citation statements)

References 6 publications

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“…The RF characterization was carried out on an Agilent PNA-L network analyzer. The pad parasitic was deembedded from the S-parameter by performing a separate set of measurement on a single "through" test fixture [15], [16].…”

Section: Methodsmentioning

confidence: 99%

Self-Biased Low Loss Conductor Featured With Skin Effect Suppression for High Quality RF Passives

et al. 2012

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We present experimental data for artificial metaconductors exhibiting skin effect suppression at microwave frequencies. The metaconductor consists of a stack comprising twelve periods of alternating ferromagnetic (Permalloy) and normal metal (Cu) layers. Near the effective antiferromagnetic resonant frequency the average in-plane magnetic permeability of the stack approaches zero, leading to an increase in the skin depth. Compared to a Cu-based device, up to 70% loss reduction has been achieved by a metaconductor based coplanar wave guide at 10 GHz without changing the propagation wavelength. Moreover, unlike conventional magnetic devices, no external magnetic bias is required due to the large magnetic anisotropy present in the ferromagnetic layers.Index Terms-Coplanar wave guide, ferromagnetic resonance, magnetic thin film, metamaterial, radio frequency.

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Section: Methodsmentioning

confidence: 99%

Self-Biased Low Loss Conductor Featured With Skin Effect Suppression for High Quality RF Passives

et al. 2012

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“…In the area of parasitic deembedding, Fujishima [11] has presented known deembedding methodologies. Daniel et al [12] have provided a deembedding methodology using a through-only structure. Aguilera et al [13] have compared different deembedding methodologies.…”

Section: Previous Workmentioning

confidence: 99%

SIS wide-band model extraction methodology for SOI on-chip inductor

Topaloglu

Goo

Loke

et al. 2010

2010 International Conference on Microelectronic Test Structures (ICMTS)

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On-chip inductors are recently in high demand even for digital applications due to strict jitter and phase noise requirements in oscillators. Accurate and fast modeling techniques are needed to enable low-cost and fast silicon turnaround. We present a fast and accurate methodology named scaled, iterative, and sampled (SIS) non-linear least squares optimization to extract wide-band model parameters suitable up to 20 GHz for inductor. To test our methodology, we implement a silicon-on-insulator (SOI) inductor in a 45 nm technology. The inductor is suitable for 8 to 20 GHz operation with 1.45 nH inductance and a quality factor of 17 at 10 GHz. We correlate our results to silicon measurements and achieve a very good fit between our models and silicon data. With our methodology, we achieve modelturnaround time of a few hours.

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“…The deembedding proposed in [9] is used in this paper. The method is based on bisection of a single two-port THRU structure.…”

Section: Waveguide Characterizationmentioning

confidence: 99%

Line Defect-Layered EBG Waveguides in Dielectric Substrates

Ouassal

Shaker

Roy

et al. 2018

International Journal of Antennas and Propagation

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A dielectric-based multilayer structure composed of U-shaped rings (ML-UR) is used to develop a class of novel electromagnetic band gap (EBG) slab waveguide. The structure has two band gaps that narrow down as dielectric constant is increased. The EBG slab waveguide is created by embedding a single-layer line defect inside the 3D crystal of the EBG slab guide. Unlike our previously published foam-based EBG structure, the use of dielectric spacer in the EBG waveguides offers significant advantages in terms of overall size, structure reliability, and design flexibility. The waveguide structures reported in this paper are designed to operate at X-band (8-12 GHz) while being fed by coplanar-slotline transitions. Prototypes were fabricated and characterized experimentally. The insertion loss decreases by decreasing the number of full lattices of ML-UR surrounding the channels. The proposed waveguide has potential in microwave components such as directional couplers, phase shifters, and antenna array feeding networks.

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Network analyzer measurement de-embedding utilizing a distributed transmission matrix bisection of a single THRU structure

Cited by 21 publications

References 6 publications

Self-Biased Low Loss Conductor Featured With Skin Effect Suppression for High Quality RF Passives

Self-Biased Low Loss Conductor Featured With Skin Effect Suppression for High Quality RF Passives

SIS wide-band model extraction methodology for SOI on-chip inductor

Line Defect-Layered EBG Waveguides in Dielectric Substrates

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