2019
DOI: 10.1002/pssa.201800856
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Near‐Surface [Ga]/([In]+[Ga]) Composition in Cu(In,Ga)Se2 Thin‐Film Solar Cell Absorbers: An Overlooked Material Feature

Abstract: The chemical and electronic structures in the near‐surface region of Cu(In,Ga)Se2 thin‐film solar cell absorbers are investigated using nondestructive soft and hard X‐ray photoelectron spectroscopy. In addition to a pronounced surface Cu‐depletion, the [Ga]/([In]+[Ga]) composition indicates that the topmost surface is Ga‐poor (or In‐rich). For the studied depth region, common depth profiling techniques generally fail to provide reliable information and, thus, the near‐surface chemical and electronic structure … Show more

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Cited by 6 publications
(3 citation statements)
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“…The GGI calculated from electrons with a smaller IMFP is higher than the one calculated from electrons with larger IMFP, and so, we conclude that all samples have a Ga-enriched surface region. This enrichment is in contrast to previous studies on LT and HT absorbers, exhibiting Ga-deficient surfaces. The Ga concentration at the surface might have an impact on the effects induced by the alkali PDT since it was recently proposed that RbF PDT only results in the formation of Rb-In-Se-type surface species when performed on In-containing chalcopyrites .…”
Section: Resultscontrasting
confidence: 99%
“…The GGI calculated from electrons with a smaller IMFP is higher than the one calculated from electrons with larger IMFP, and so, we conclude that all samples have a Ga-enriched surface region. This enrichment is in contrast to previous studies on LT and HT absorbers, exhibiting Ga-deficient surfaces. The Ga concentration at the surface might have an impact on the effects induced by the alkali PDT since it was recently proposed that RbF PDT only results in the formation of Rb-In-Se-type surface species when performed on In-containing chalcopyrites .…”
Section: Resultscontrasting
confidence: 99%
“…31) Offsets may also be complicated by the presence of Cu depletion near the interface. 32) Despite a cliff-like offset, the fits are nonetheless dominated by absorber recombination, c , a as reported for materials in this Ga composition range. 5,33,34) Throughout the composition range, we find that c a increases dramatically with x.…”
Section: Discussionmentioning
confidence: 62%
“…The three-step (H 2 Se/Ar/H 2 Se) reaction process achieved a homogenized Ga distribution through a reduced Se supply. However, the three-step process resulted in Ga depletion at the CIGSe surface due to the presence of InSe during the second annealing step, which significantly deteriorated the device performance. Félix et al reported a Ga-poor (or In-rich) topmost surface by investigating the near-surface Ga/(In + Ga) composition in CIGSe absorbers. The Ga-poor (or In-rich) topmost surface led to a reduction in the surface band gap, which deteriorated the open-circuit voltage.…”
Section: Introductionmentioning
confidence: 99%