Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078)
DOI: 10.1109/date.1999.761120
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Minimal length diagnostic tests for analog circuits using test history

A.V. Gomes1,
Abhijit Chatterjee2
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Cited by 5 publications
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References 15 publications
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Test generation for fault isolation in analog circuits using behavioral models

Cherubal
1
,
Chatterjee2
Proceedings of the Ninth Asian Test Symposium
3
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1
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Test generation for fault isolation in analog circuits using behavioral models

Cherubal
1
,
Chatterjee2
Proceedings of the Ninth Asian Test Symposium
3
0
1
0
View full textAdd to dashboardCite

Distance constrained dimensionality reduction for parametric fault test generator

Gomes
1
,
Chatterjee
2
Proceedings 10th Asian Test Symposium
3
0
1
0
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Test generation based diagnosis of device parameters for analog circuits

Chatterjee1,
Chatterjee2
Proceedings Design, Automation and Test in Europe. Conference and Exhibition 2001
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