Abstract:High-performance InGaN light-emitting diodes consisting of 120 side-by-side and individually addressable microstripe elements have been successfully fabricated. Each stripe in these devices is 24 pm in width and 3600 mu m long, with a center-to-center spacing between adjacent stripes of 34 mu m. The emission wavelengths demonstrated range from ultraviolet (UV) (370 nm) to blue (470 nm) and green (520 nm). The devices show good uniformity and performance due to finger-pattern n-electrodes running between adjace… Show more
“…1.a), this demonstrates that the CHF 3 pre-metallization plasma treatment prevents current leakage through the p-GaN-metal interface, equivalent to a very effective electrical passivation of the p-GaN surface. With a series resistance of ~80Ω, device A presents electrical characteristics as good as those previously reported for micro-stripe LEDs made with the standard mesa-etch process [5]. Optical measurements were also performed and results are plotted on Fig 2.b.…”
Section: Resultssupporting
confidence: 65%
“…Optical measurements were also performed and results are plotted on Fig 2.b. An averaged output power of ~500µW at 20mA was obtained which is twice as high as the power already reported for a similar micro-stripe design made with the standard process [5]. We believe that the lower number of fabrication steps in the planar process may result in improved current spreading, and so to better efficiency.…”
Section: Resultsmentioning
confidence: 48%
“…For purposes of comparison, a micro-LED array layout corresponding to an earlier type of mesa-etched device was chosen and consists of 120 pixels, each 20 µm wide by 3.6 mm in length, with a gap between adjacent stripes of 14 µm [5]. This geometry allows also critical evaluation of issues such as cross-talk and current spreading.…”
Section: Design and Fabrication Of The Devicesmentioning
Micro-pixelated GaN light-emitting diodes (‘micro-LED’s) offer attractions for a wide range of applications including microdisplays, mask-free photolithography, lab-on-a-chip and bioinstrumentation [1]. Mesa dry etching methods have underpinned the development of this technology to date. Here we propose and demonstrate a new planar process which simplifies the process flow and permits individually-addressable pixelated devices to be fabricated without any obvious degradation of electrical and optical performance. The approach is based on the intrinsic high resistivity of the p-type GaN layer for pixel to pixel electrical isolation and on a CHF3 plasma treatment to dramatically reduce current leakage through the p-GaN/metal interface. Consequently, this process requires a lower number of fabrication steps than previously used processes using mesa etching for pixel definition and dielectric deposition for electrical insulation [2]. It leads to a planar active area well suited for further integration of functional micro-elements, including microfluidic-channels, microoptics or luminescent materials for colour conversion [3, 4]. This new fabrication route has been validated by fabricating and characterizing an individually addressable micro-stripe LED array emitting at 470 nm
“…1.a), this demonstrates that the CHF 3 pre-metallization plasma treatment prevents current leakage through the p-GaN-metal interface, equivalent to a very effective electrical passivation of the p-GaN surface. With a series resistance of ~80Ω, device A presents electrical characteristics as good as those previously reported for micro-stripe LEDs made with the standard mesa-etch process [5]. Optical measurements were also performed and results are plotted on Fig 2.b.…”
Section: Resultssupporting
confidence: 65%
“…Optical measurements were also performed and results are plotted on Fig 2.b. An averaged output power of ~500µW at 20mA was obtained which is twice as high as the power already reported for a similar micro-stripe design made with the standard process [5]. We believe that the lower number of fabrication steps in the planar process may result in improved current spreading, and so to better efficiency.…”
Section: Resultsmentioning
confidence: 48%
“…For purposes of comparison, a micro-LED array layout corresponding to an earlier type of mesa-etched device was chosen and consists of 120 pixels, each 20 µm wide by 3.6 mm in length, with a gap between adjacent stripes of 14 µm [5]. This geometry allows also critical evaluation of issues such as cross-talk and current spreading.…”
Section: Design and Fabrication Of The Devicesmentioning
Micro-pixelated GaN light-emitting diodes (‘micro-LED’s) offer attractions for a wide range of applications including microdisplays, mask-free photolithography, lab-on-a-chip and bioinstrumentation [1]. Mesa dry etching methods have underpinned the development of this technology to date. Here we propose and demonstrate a new planar process which simplifies the process flow and permits individually-addressable pixelated devices to be fabricated without any obvious degradation of electrical and optical performance. The approach is based on the intrinsic high resistivity of the p-type GaN layer for pixel to pixel electrical isolation and on a CHF3 plasma treatment to dramatically reduce current leakage through the p-GaN/metal interface. Consequently, this process requires a lower number of fabrication steps than previously used processes using mesa etching for pixel definition and dielectric deposition for electrical insulation [2]. It leads to a planar active area well suited for further integration of functional micro-elements, including microfluidic-channels, microoptics or luminescent materials for colour conversion [3, 4]. This new fabrication route has been validated by fabricating and characterizing an individually addressable micro-stripe LED array emitting at 470 nm
“…The proposed optical interconnect architecture comprises a light source and an integrated driver, described in detail in [7], a detector similar to [5], and ultra-fast PPM coder/decoder logic. The PPM decoding process is achieved through a time-to-digital converter (TDC).…”
Section: System Architecturementioning
confidence: 99%
“…Optical data signals are generated, for example, in an integrated CPU by a micro LED similar to [7]. A sub-nanosecond optical pulse was recently demonstrated for this device using CMOS drivers that occupy a fraction of the area of a pad.…”
Abstract1 -In this paper we propose to eliminate all data and control pads generally present in conventional chips and to replace them with a new type of ultra-compact, low power optical interconnect implemented almost entirely in CMOS. The proposed scheme enables entirely optical through-chip buses that could service hundreds of thinned stacked dies. Very high throughputs and communication density could be achieved even in tight power budgets. The core of the optical interconnect is a single-photon avalanche diode operating in pulse position modulation. We demonstrate how throughputs of several gigabits per second may be achieved. We also show a systematic analysis and trade-offs of such a system and preliminary results to support its suitability in emerging DSM technologies.
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