Losses in Microstrip

Pucel, R.A.; Masse, D.; Hartwig, C.P.

doi:10.1109/tmtt.1968.1126691

Cited by 478 publications

(118 citation statements)

References 8 publications

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“…Letting a = ad + a c, i. e., identifying the total attenuation as the sum of the contribution due to dielectric and ohmic losses, we obtain the following relationships This is a reasonable assumption as verified experimentally by Pucel, Mass6, and Hartwig (1968).…”

Section: V Losses In Microstrip Linessupporting

confidence: 54%

“…The total attenuation constant a was measured by Pucel, Mass6, and Hartwig (1968) for a practical microstrip line. The results for the case of a rutile substrate are reproduced in Figure 33.…”

Section: V Losses In Microstrip Linesmentioning

confidence: 99%

“…An alternative approach has been followed by Pucel, Mass6, and Hartwig (1968) who have developed formulas that express ac and a d in terms of structural parameters of the guide and the filling factor iatroduced by Wheeler (1965). The expression for ad' the contribution due to dielectric losses, is given by…”

mentioning

confidence: 99%

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Analysis of Microstrip Transmission Lines

Mittra

Itoh

1974

Advances in Microwaves

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Section: V Losses In Microstrip Linessupporting

confidence: 54%

Section: V Losses In Microstrip Linesmentioning

confidence: 99%

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Analysis of Microstrip Transmission Lines

Mittra

Itoh

1974

Advances in Microwaves

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“…One assumes that the dielectric substrate is characterized by its height h, relative permittivity ε r and loss constant tan(δ). The corresponding characteristic impedance Z c and the propagation constant γ(f ) = α(f )+j ·β(f ) can be deduced from these physical properties according to the formulations reported in [16,17,32] as expressed in (1) and (3).…”

Section: Extraction Of the Microstrip Line Rlcg-parametersmentioning

confidence: 99%

Transient Response Characterization of the High-Speed Interconnection RLCG-Model for the Signal Integrity Analysis

Eudes¹,

Ravelo²,

Louis³

2011

PIER

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Abstract-This paper is devoted on the characterization method of RF/digital PCB interconnections for the prediction of the highspeed signal transient responses. The introduced method is based on the use of the interconnection line RLCG-model. Theoretical formulae enabling the extraction of the electrical per-unit length parameters R, L, C and G in function of the interconnection line physical characteristics (width, length, metal conductivity, dielectric permittivity . . . ) are established. Then, by considering the second order approximation of the interconnection RLCG-model transfer matrix, the calculation process of the transient responses from the interconnection system transfer function is originally established. To demonstrate the relevance of the proposed model, microwavedigital interconnection structure comprised of millimetre microstrip line driven and loaded by logic gates which are respectively modelled by their input and output impedances was considered. Then, comparisons between the SPICE-computation results and those obtained from the proposed analytical model implemented in Matlab were made. As results, by considering a periodical square microwave-digital excitation signal with 2 Gbits/s rate, transient responses which are very wellcorrelated to the SPICE-results and showing the degradation of the tested signal fidelity are observed. The numerical computations confirm that the proposed modelling method enables also to evaluate accurately the transient signal parameters as the rise-/fall-times and the 50% propagation delay in very less computation time. For this reason, this analytical-numerical modelling method is potentially interesting for the analysis of the signal integrity which propagates

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“…(62) The relative permittivity is obtained from the resonant frequencies of a cavity. The attenuation constant in a microstrip has been calculated [132]. However, if the ratio t/S (where S is the relevant skin depth and t is the thickness of the conductor) is small or close to unity [133,134] Reference [135] gives values for A for superconductors.…”

Section: 4mentioning

confidence: 99%