2001
DOI: 10.6028/nist.tn.1520
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Dielectric and conductor-loss characterization and measurements on electronic packaging materials

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Cited by 71 publications
(49 citation statements)
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References 120 publications
(66 reference statements)
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“…• Measurements on plastics are given in References [9,[161][162][163][164][165][166][167][168][169][170][171][172].…”
Section: Discussionmentioning
confidence: 99%
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“…• Measurements on plastics are given in References [9,[161][162][163][164][165][166][167][168][169][170][171][172].…”
Section: Discussionmentioning
confidence: 99%
“…are the attenuation and phase coefficients, where a includes loss due to the conductors, dielectric, and radiation: a = ac + ad + cXr-Here, ac can be approximated by [6] R{u) Oir - (18) Zc{ideal) Equation (18) is very approximate, and in microstrip, stripline, coplanar and other waveguides, there are significant corrections [9]. The dielectric attenuation is eoe: T^r = -yJeoc'^^ofJ'rtandd.…”
Section: Overview Of Relevant Circuit Theorymentioning
confidence: 99%
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“…The characterization of packaging materials in general has been the topic of many contributions. A good overview of the existing techniques is given in [6] and the references therein. One possible technique is the characterization of substrate materials by means of scattering (S-) parameter measurements.…”
Section: Introductionmentioning
confidence: 99%