2015
DOI: 10.1016/j.jcrysgro.2014.10.012
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Evolution of the surface morphology of AlN epitaxial film by HVPE

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Cited by 10 publications
(5 citation statements)
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“…Besides, the growth rate is The surface morphology of AlN grown at initial stage [45] . (c) 1200 nm grown on sapphire substrates [44] .…”
Section: Ht-hvpementioning
confidence: 99%
See 2 more Smart Citations
“…Besides, the growth rate is The surface morphology of AlN grown at initial stage [45] . (c) 1200 nm grown on sapphire substrates [44] .…”
Section: Ht-hvpementioning
confidence: 99%
“…In 2016, Zhang et al [44] reported the influence of the initial growth condition of AlN thin films grown on various substrates by the low-temperature HVPE. The substrates include 6H-SiC, GaN/sapphire templates and sapphire.…”
mentioning
confidence: 99%
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“…In previous reports, both AlN and GaN high-quality thick films have been prepared by HVPE. [37][38][39] However, the research of h-BN grown by HVPE is still in the early stages. Nicolas Coudurier reported h-BN films grown by HVPE in 2013, but the films were dominated by the amorphous or turbostratic BN (t-BN).…”
Section: Introductionmentioning
confidence: 99%
“…AlN bulk crystals are promising as substrates of AlGaN-based deep ultraviolet light emitters and high-frequency electronic devices with high-breakdown voltages. Currently, AlN substrates are fabricated mainly by the physical vapor transport method [1][2][3][4][5] and hydride vapor phase epitaxy method [6][7][8][9][10]. To lower costs, increase the diameter, and improve the crystalline qualities, these methods must be refined.…”
Section: Introductionmentioning
confidence: 99%