2001
DOI: 10.1016/s0257-8972(00)01045-8
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Energy distribution and depth profile in BF3 plasma doping

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Cited by 13 publications
(7 citation statements)
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“…As conventional implanters are not adapted to very low ion energies, implantation of doping elements via PBII processing with a collisional sheath is becoming a useful tool for shallow implantation. Plasma doping (or PLAD) thus constitutes, by far, the most important application of PBII in microelectronics [10,21,23,[126][127][128][129][130][131][132][133][134], along with the production of SOI (silicon on insulator) wafers with the smart-cut process [135][136][137][138].…”
Section: Plasma Dopingmentioning
confidence: 99%
“…As conventional implanters are not adapted to very low ion energies, implantation of doping elements via PBII processing with a collisional sheath is becoming a useful tool for shallow implantation. Plasma doping (or PLAD) thus constitutes, by far, the most important application of PBII in microelectronics [10,21,23,[126][127][128][129][130][131][132][133][134], along with the production of SOI (silicon on insulator) wafers with the smart-cut process [135][136][137][138].…”
Section: Plasma Dopingmentioning
confidence: 99%
“…As conventional implanters are not adapted to very low ion energies, implantation of doping elements via PBII processing with a collisional sheath is becoming a useful tool for shallow implantation. Plasma doping (or PLAD) thus constitutes, by far, the most important application of PBII in microelectronics [17][18][19][20][21][22][23][24][25][26][27], along with the production of silicon on insulator (SOI) wafers with the smart-cut process [28][29][30][31].…”
Section: Modification Of Electric Properties: Plasma Dopingmentioning
confidence: 99%
“…PIII is a promising alternative although one need to realize that PIII does not have the feature of mass selection. The junction depth versus PIII-bias and other details have been discussed recently [44,47,48].…”
Section: Concept 7 Piii As a Technique To Fabricate P/n Junctionsmentioning
confidence: 99%
“…(5) PIII&D processes are not mono-energetic as discussed in detail by various researchers [47,79]. This feature may or may not be tolerable depending on the desired process.…”
Section: Issues and Limitationsmentioning
confidence: 99%