2014
DOI: 10.1155/2014/927696
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Emerging Nonvolatile Memories to Go Beyond Scaling Limits of Conventional CMOS Nanodevices

Abstract: Continuous dimensional scaling of the CMOS technology, along with its cost reduction, has rendered Flash memory as one of the most promising nonvolatile memory candidates during the last decade. With the Flash memory technology inevitably approaching its fundamental limits, more advanced storage nanodevices, which can probably overcome the scaling limits of Flash memory, are being explored, bringing about a series of new paradigms such as FeRAM, MRAM, PCRAM, and ReRAM. These devices have indeed exhibited bette… Show more

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Cited by 15 publications
(16 citation statements)
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“…8 Mott physics has been suggested for applications in the context of field effect transistors 9 and memory devices. 10 Approaches based on the dynamical mean-field theory (DMFT) 11,12 have been very successful in the description of strong correlations. In case of sufficiently shortranged interactions, strongly correlated systems are often described by an effective Hubbard model.…”
mentioning
confidence: 99%
“…8 Mott physics has been suggested for applications in the context of field effect transistors 9 and memory devices. 10 Approaches based on the dynamical mean-field theory (DMFT) 11,12 have been very successful in the description of strong correlations. In case of sufficiently shortranged interactions, strongly correlated systems are often described by an effective Hubbard model.…”
mentioning
confidence: 99%
“…However, in order for polymeric memristor to rival with the resistive memristor, the resistance ratio and the stability are two main issues that need to be addressed soon. The ability to provide a wide resistance tenability, a large resistance ratio (about 10 3 ), long data retention time, and great robustness using ferroelectric memristor has also been demonstrated [62,63], which makes ferroelectric memristor a very prospective contender for applications in nonvolatile memories and logic devices. Nevertheless, as ferroelectric material will lose its ferroelectric characteristic at a very thin thickness, the difficulty in downscaling ferroelectric memristor cell has posed a strong limit to its density improvement.…”
Section: Resultsmentioning
confidence: 99%
“…This means that although the processing power of these systems has been improved over the last few years, it is not possible to take advantage of all its capabilities due to the limited bandwidth of the data bus (Von-Neumann bottleneck). When taking scalability into account, these systems also pose a problem due to the decrease in performance that comes as a consequence of CMOS technology limitations [2]. The increase in operating frequency and device density would involve a higher power consumption and increased operating temperatures.…”
Section: Introductionmentioning
confidence: 99%