2001
DOI: 10.1016/s0042-207x(00)00443-7
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Electrical and switching properties of amorphous films based on the Ge–Se–Tl system

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Cited by 30 publications
(22 citation statements)
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“…It is observed thatV th increases linearly with the film thickness. The observed relation between the thickness andV th agrees well with the previous observations for different amorphous semiconductor materials [30,31]. Fig.…”
Section: Dynamic and Static I-v Characteristicssupporting
confidence: 91%
“…It is observed thatV th increases linearly with the film thickness. The observed relation between the thickness andV th agrees well with the previous observations for different amorphous semiconductor materials [30,31]. Fig.…”
Section: Dynamic and Static I-v Characteristicssupporting
confidence: 91%
“…The obtained values of this ratio are given in Table 4. It is found that the mean value of the ratioε V th /E σ2 ≈ 0.5, agrees with that obtained theoretically on the basis of the electrothermal model for the switching process [8,9] and those obtained before for other semiconducting compositions [15,[17][18][19].…”
Section: Temperature Dependence Ofv Thsupporting
confidence: 89%
“…Thus, the ratioε V th / E was calculated using the corresponding values of E , are given in Table 4. It is found the ratioε V th /E ≈ 0.5 agrees with that obtained theoretically on the basis of the electrothermal model for the switching process [9,10] and those obtained before for other semiconducting compositions [39][40][41][42].…”
Section: Temperature Dependence Of the Threshold Voltagev Thsupporting
confidence: 87%