Sb2Se3 and Te-doped Sb2Se3 films
of ∼250 nm film thickness were deposited using
a facile thermal evaporation technique from the bulk powder synthesized
via the melt quenching technique. Thermogravimetric analysis of pure
and Te-doped Sb2Se3 alloys in bulk form indicates
decomposition of the alloys in the 303–673 K temperature range.
The X-ray diffraction pattern revealed single-crystalline orthorhombic
phase stabilization of as-prepared alloys in bulk as well as in the
annealed thin films. Phase formation is also evident in the recorded
Raman spectra from the appearance of two peaks at ∼189 and
210 cm–1, which are ascribed to the Sb2Se3 Ag mode. The absorbance spectra of as-annealed
pure Sb2Se3 and Te-incorporated Sb2Se3 films exhibit significant reduction with Te doping
due to an increase in the optical band gap. The conductivity in as-annealed
Sb2Se3 and (0.08%)Te-doped Sb2Se3 films recorded from 308 K (room temperature) to 392 K show
a decrease in DC conductivity and activation energy with the insertion
of Te in the Sb2Se3 system. Such a trend in
conductivity and activation energy is attributed to arise as a result
of structural changes as well as defect passivation enabled by Te
insertion in the alloy. Interestingly, the DC conductivity is in the
range of ∼10–7 Ω–1 cm–1 at 308.5 K, which is 10 times higher than
that of the previously reported conductivity of Sb2Se3 films. Presently, the nonpreferential grain growth, undesirable
deep-level defects, and surface oxidation in Sb2Se3 thin films are pressing issues that render them unsuitable
for practical application in devices. Herein, this study brings to
the fore a strategy to overcome these issues by doping Te in Sb2Se3 thin films, and hence it is a step forward
towards the replacement of environmentally toxic CdTe-based devices.