1974
DOI: 10.1002/pssa.2210250110
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Determination of the capture ratecn of the gold acceptor level from single injection n+–i–n+ silicon SCLC diodes

Abstract: The value of the capture rate cn and the capture cross section σn of the gold acceptor level is determined from single injection SCLC measurements at high resistivity Au‐compensated n+–i–n+‐Si samples. By means of a single and double pulse method the time dependence of the current is measured for the capture and reemission of electrons by the Au‐acceptor level. The capture and emission time constant τ italicc n and τe were calculated according to the SRH model. From the temperature dependence of τe the activat… Show more

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Cited by 11 publications
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