2003
DOI: 10.1063/1.1570516
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Cu depletion at the CuInSe2 surface

Abstract: Articles you may be interested inNa incorporation into Cu(In,Ga)Se2 thin-film solar cell absorbers deposited on polyimide: Impact on the chemical and electronic surface structureThe chemical composition of the ͑112͒B surface of epitaxial CuInSe 2 thin films is investigated by angle resolved x-ray photoelectron spectroscopy. Results show that a severe Cu depletion exists in the top 1-2 atomic layers. No bulk second phase is found at the surface. The source of this depletion and its relation to the Cd doping at … Show more

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Cited by 107 publications
(100 citation statements)
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“…D) was explained in the past by the formation of an ordered defect compound (ODC) layer 46,47 or by surface reconstruction. 51,52 While according to first-principles calculations the ODC can be considered as periodic repetition of the charge compensated (2 V Cu À þ In Cu 2þ ) defect complex (as described in Ref. 53), it was also suggested by theory that the surface reconstruction is based on the formation of the energetically most favorable metal-terminated (112) and selenium-terminated ( 112) CIGSe surfaces stabilized through V Cu À and subsurface In Cu 2þ defects, respectively.…”
Section: E Binding Energy Shiftmentioning
confidence: 99%
“…D) was explained in the past by the formation of an ordered defect compound (ODC) layer 46,47 or by surface reconstruction. 51,52 While according to first-principles calculations the ODC can be considered as periodic repetition of the charge compensated (2 V Cu À þ In Cu 2þ ) defect complex (as described in Ref. 53), it was also suggested by theory that the surface reconstruction is based on the formation of the energetically most favorable metal-terminated (112) and selenium-terminated ( 112) CIGSe surfaces stabilized through V Cu À and subsurface In Cu 2þ defects, respectively.…”
Section: E Binding Energy Shiftmentioning
confidence: 99%
“…Only the very first data points of the copper concentration in the SNMS depth profiles show deviations to lower values for all samples, which is most probably related to the copper depletion of chalcopyrite thin film surfaces with respect to their bulk composition. As mentioned above, it was found that this surface copper depletion is restricted to the top atomic layer and is caused by a defect-induced surface reconstruction, [25][26][27] which is not accessible by AXES. 20 The reduced copper concentration in the SNMS data could be a consequence of this.…”
Section: Sample Preparationmentioning
confidence: 99%
“…Thus, Cd doping at the CIGSe/CdS grain boundaries and conductivity inversion of the absorber from p-to n-types is inevitable. Other significant observations such as Se-S exchange within CdS-CIGSe, Cd diffusion in CIGSe, Cu-Cd interdiffusion at CdS/CIGSe interface, alkali-oxygen (Na-O) impurity accumulations at the interface, Cu 2−x Se secondary phase, and Cd-Se formations are also reported [36][37][38][39]. However, the CdS/CIGSe junction interface study is still a debatable research topic which needs further clarifications.…”
Section: Cise/cigse Materials Properties and Device Structurementioning
confidence: 99%