CADless laser assisted methodologies for failure analysis and device reliability

Deyine, Amjad; Sanchez, Kévin; Perdu, Philippe; Battistella, F.; Lewis, Dean

doi:10.1016/j.microrel.2010.07.131

Cited by 2 publications

(1 citation statement)

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“…An accurate quantitative prediction of the evolution of the susceptibility would rely on a characterization of degradation mechanisms which affects the transistors designed in this technology and the extraction of equivalent models to insert in the circuit schematic [15]. Moreover, failure analysis methods such as laser stimulation can help to locate precisely the root cause of susceptibility increase [16].…”

Section: Simulation Of the Impact Of Transistor Degradations On Plmentioning

confidence: 99%

Prediction of Long-term Immunity of a Phase-Locked Loop

Boyer

Dhia

et al. 2012

J Electron Test

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Degradation mechanisms accelerated by harsh conditions (high temperature, electrical stress) can affect circuit performances. Submitted to electromagnetic interferences, aged components can become more susceptible, which stirs up questions about the safety level of the final application. Unfortunately, the impact of circuit aging on its susceptibility level remains under evaluated and is not taken into account at circuit design level. This paper presents a first attempt of a modeling methodology aiming at predicting the impact of circuit aging on the susceptibility to electromagnetic interferences. This methodology is applied to model and explain the measured variations of the susceptibility level of phase-locked loop after an accelerated-life test.

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Section: Simulation Of the Impact Of Transistor Degradations On Plmentioning

confidence: 99%